1990
DOI: 10.1116/1.576455
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The influence of microstructure on stress state of sputter deposited chromium nitride films

Abstract: Articles you may be interested inResistive switching characteristics and set-voltage dependence of low-resistance state in sputter-deposited Sr Zr O 3 : Cr memory films Hot hollow cathode diffuse arc deposition of chromium nitride films J. Vac. Sci. Technol. A 23, 959 (2005); 10.1116/1.1914813In situ measurement of surface stress evolution during sputter deposition of Co Cr X ∕ Cr ( X = Pt , Ta ) thin film and its magnetic properties

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Cited by 26 publications
(6 citation statements)
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“…This corresponds to a measured MgO lattice constant of 0.4211 nm, close to the literature value of 0.4212 nm 32 or 0.4213 nm, 33 and an out-of-plane CrN lattice constant of 0.4179 nm. This is in the range of reported bulk values, 0.4133-0.4185 nm, 10,15,[34][35][36] but likely indicates a slight compressive strain due to differential thermal contraction during cooling from the 850 °C growth temperature, similar to what has been previously reported for epitaxial CrN grown on MgO(001). 15 We note here that no secondary impurity phase is detected by XRD for all layers in this study.…”
Section: Optical Reflectance Was Measured With a Nicolet Magna Ir-560supporting
confidence: 87%
“…This corresponds to a measured MgO lattice constant of 0.4211 nm, close to the literature value of 0.4212 nm 32 or 0.4213 nm, 33 and an out-of-plane CrN lattice constant of 0.4179 nm. This is in the range of reported bulk values, 0.4133-0.4185 nm, 10,15,[34][35][36] but likely indicates a slight compressive strain due to differential thermal contraction during cooling from the 850 °C growth temperature, similar to what has been previously reported for epitaxial CrN grown on MgO(001). 15 We note here that no secondary impurity phase is detected by XRD for all layers in this study.…”
Section: Optical Reflectance Was Measured With a Nicolet Magna Ir-560supporting
confidence: 87%
“…A narrow region of a typical XRD spectrum is shown in Fig. 2͑a͒ 43.54°, yielding a lattice constant a Ќ along the film growth direction of 0.4165 nm. The full width at half maximum intensity ⌫ 2 of the CrN 002 K ␣1 peak is 0.10°, only slightly larger than the value ⌫ 2 ϭ0.07°obtained for the MgO 002 K ␣1 substrate peak.…”
Section: Microstructure and Surface Morphologymentioning
confidence: 99%
“…41 We obtain a o ϭ0.4162Ϯ0.0008 nm, which is within the range of previously reported values, 0.4133-0.4185 nm, obtained from polycrystalline layers and bulk powder samples. 1,19,[42][43][44] Atomic force microscopy investigations reveal dramatic changes in CrN͑001͒ surface morphology as a function of J N 2 ϩ /J Cr . Figure 3 shows typical 3ϫ3 m 2 AFM images from 500-nm-thick CrN͑001͒ layers grown at T s ϭ600°C with incident ion-to-metal ratios of J N 2 ϩ /J Cr ϭ1.7 ͓Fig.…”
Section: Microstructure and Surface Morphologymentioning
confidence: 99%
“…[1][2][3][4] Other characteristics of CrN include a high hardness, a high toughness, and a low mechanical stress. [9][10][11][12] There are two stable phases of chromium nitride at room temperature: Cr 2 N and CrN. [9][10][11][12] There are two stable phases of chromium nitride at room temperature: Cr 2 N and CrN.…”
Section: Introductionmentioning
confidence: 99%