The influence of No Fault Found in analogue CMOS circuits

Abstract

The most difficult fault category in electronic systems is the "No Fault Found" (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined.

Testing for Intermittent Resistive Faults in CMOS Integrated Systems

“…The influence of intermittent faults on digital systems has been studied in many papers [5][6][7][8][9] by simulation-based fault injection at RTL-level. In [10] and [11], we have proposed a simulation model for IRFs and analysed the influence of IRFs on a simple analogue OpAmp and a simple digital circuit (full-adder) at the transistor level via simulation. Here, based on our previous IRF model a hardware IRF This paper is organized as follows.…”

Intermittent Resistive Faults in Digital CMOS Circuits

“…SIMULATING WITH INTERMITTENT RES An example of a measured intermittent resisti shown in Figure 1. Based on this kind of exp software module has been developed that is able faults in a Cadence Virtuoso environment [7]. T of our intermittent resistive fault injector is sho There are six parameters that can be set accordin application, with a minimum and maximum va (random) distribution.…”

“…T of our intermittent resistive fault injector is sho There are six parameters that can be set accordin application, with a minimum and maximum va (random) distribution. The parameters are simila reference [7]. The actual values and distribution simulations are listed in Table I.…”

“…The model has been replacing a normal wire in the net li A screenshot of our IRF evalu shown in Figure 3. It shows pa (background), a (white) window wh fault parameters can be edited by and the required observation graph of the circuit; the latter can be Analogue, mixed-signal [7] as we evaluated. The next section will simulations with respect to digital ci…”

Investigation of Intermittent Resistive Faults in Digital CMOS Circuits

“…In Ref. 12 we have proposed a model for IRFs and analyzed the in°uence of IRFs on analogue systems at the transistor level. In this paper, based on our model, the impact of IRFs on a digital system at transistor level will be investigated.…”