The influence of substrate temperature on the optical and micro structural properties of cerium oxide thin films deposited by RF sputtering

Surface and morphology analyses, and voltammetry studies for electrochemical determination of cerium(iii) using a graphene nanobud-modified-carbon felt electrode in acidic buffer solution (pH 4.0 ± 0.05)

“…9E). 64 The peak at approximately 900 eV indicated that the adsorbed Ce 3+ on the modied electrode bonds with additional oxygen atoms, for instance, the oxygen of the hydroxyl and carboxyl groups present in the GNB, which is in accordance with already reported CeO 2 compounds. 65,66 The peak observed at approximately 882 and 901 eV in both surveys and the high-resolution spectrum of Ce 3d indicates that the cerium ions adsorbed onto the modied electrode surface are in a +4 oxidation state, not a +3 state.…”

Visible Emission on Nanostructured CeO2 Thin Films Obtained by Spray Pyrolysis

“…The emission at energies near 3.0 eV (around 400 nm) has been already reported for nanocrystalline materials or thin films. [24,25,34,39,41,42,48] These peaks are usually associated with the hopping of electrons from levels in Ce 3þ 4f, located in the bandgap, to O 2p, [42] although they have also been associated with the O defective secondary phases. [30] Yu et al suggest that the peaks' positions are related to nanoparticle size.…”

“…[44] Mochizuki proposes different types of defects in this energy region. [49] Experimentally, wide peaks are reported between 400 and 650 nm in nanomaterials [39,41,48] and thin films, [21,23,24,30] but peaks centered at 562, 575, 590, and 618 nm have only been reported in nanostructured and doped materials. [25,46,47,50] Ursaki et al reported peaks at 574, 617, and 622 nm in Sm-doped ceria thin films, which are associated with Sm 3þ -O 2p band transitions.…”

“…[6,[13][14][15][16] The use of nanostructured thin films increases the potential applications of this material. [11,17,18] CeO 2 thin films have been prepared by different physical and chemical methods, including flash evaporation, [19] electron-beam evaporation, [20][21][22] sputtering, [3,[23][24][25][26][27][28] laser ablation, [12,[29][30][31][32] and spray pyrolysis. [2,10,11,33,34] In particular, spray pyrolysis is a large-scale production method with advantages such as low cost and versatility when considered as an alternative route to produce thin oxide films.…”

Fabrication of Sputtered Ce/La, La/Ce Oxide Bilayers on AA6061 and AA7075 Aluminum Alloys for the Development of Corrosion Protective Coatings

“…In this equation, k is the Scherrer constant (0.9 for sphere crystallites), λ is the X-ray wavelength (0.15418 nm), is the full width at half medium (hkl) in radians of XRD peak, and is the Bragg angle. The pseudo-Voigt profile function was used to determine the full-width and half-maximum broadening, considering symmetrical peaks for the fitting [ 40 , 41 , 42 ]. The crystallite sizes for lanthanum specimens varied from ~0.9 to 12.8 nm with a film thickness ranging from ~269.5 to 390.2 nm (60 W) and from ~499.0–835.5 nm (80 W), confirming the trend to diminish the crystallite size with the process parameters ( Table 1 ).…”