The scaling effect on Ag 3 Sn growth behaviours in Sn-3.0Ag-0.5Cu (SAC305) micro-joints of flip chip assemblies was investigated using thermal shock (TS) tests. After assembly reflow, the large plate-like Ag 3 Sn compounds only emerged from the Cu interface of small joints, which was strongly related with a higher local Ag concentration in the remaining solder. During TS cycling, the growth of Ag 3 Sn grains exhibited comparatively more pronounced growth in the solder matrix of small joints, due to the stronger strain-enhanced coarsening induced by more cycle stress and strain. Coarsening kinetic models based on TS experiments were employed to predict Ag 3 Sn growth, the kinetic constants N were determined to clarify the correlation of the joints scaling and Ag 3 Sn coarsening in depth.