1971
DOI: 10.1016/s0038-1101(71)80009-6
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The investigation of phosphorus diffusion in evacuated, sealed tubes using tracer methods

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Cited by 9 publications
(1 citation statement)
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“…Thus, PECVD BSG emitters can be produced with a silicon nitride capping layer. Also, the capping layer works as a diffusion barrier and prevents a compensating in-diffusion of phosphorus into the silicon substrate, see also [62][63][64][65][66].…”
Section: Pecvd Bsg Emitter With Sin X :H Capping Layermentioning
confidence: 99%
“…Thus, PECVD BSG emitters can be produced with a silicon nitride capping layer. Also, the capping layer works as a diffusion barrier and prevents a compensating in-diffusion of phosphorus into the silicon substrate, see also [62][63][64][65][66].…”
Section: Pecvd Bsg Emitter With Sin X :H Capping Layermentioning
confidence: 99%