The LLCCD: low-light imaging without the need for an intensifier

Jerram, Paul; Pool, P.; Bell, Ray; Burt, David; Bowring, S.; Spencer, S; Hazelwood, Mike; Moody, Ian; Catlett, Neil; Heyes, Philip S.

doi:10.1117/12.426953

Cited by 168 publications

(101 citation statements)

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“…This enables performance with an equivalent input noise of much less than 1 rms electron at pixel rates up to and beyond those required for TV imaging applications. These devices have been commercially available since 2001 [2] and their ultra-low noise, high resolution, high-quantum efficiency, and robustness to over exposure make them ideally suited to applications traditionally served by image intensifiers. As well as the "traditional" image intensifier applications, they are also finding their way into novel applications that require imaging performance that has been previously unobtainable.…”

Section: Introductionmentioning

confidence: 99%

The noise performance of electron multiplying charge-coupled devices

Robbins

Hadwen

2003

IEEE Trans. Electron Devices

289

178

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Abstract-Electron multiplying charge-coupled devices (EMCCDs) enable imaging with subelectron noise up to video frame rates and beyond, providing the multiplication gain is sufficiently high. The ultra-low noise, high resolution, high-quantum efficiency, and robustness to over exposure make these sensors ideally suited to applications traditionally served by image intensifiers. One important performance parameter of such low-light imaging systems is the noise introduced by the gain process. This work investigates the noise introduced by the electron multiplication within the EMCCD. The theory and measurements of the excess noise factor are presented. The measurement technique for determining the excess noise factor is described in detail. The results show that the noise performance matches that of the ideal staircase avalanche photodiode. A Monte Carlo method for simulating the low-light level images is demonstrated and the results compared with practical experience.Index Terms-Charge-coupled devices (CCD), image intensifiers, low-light level imaging, noise, photon counting, single photon detection.

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Section: Introductionmentioning

confidence: 99%

The noise performance of electron multiplying charge-coupled devices

Robbins

Hadwen

2003

IEEE Trans. Electron Devices

289

178

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“…This results in a reduction in effective system read noise, [1,2]. Its design is similar to that of an ordinary CCD, see figure 1, but for additional register elements after the serial register.…”

Section: Introductionmentioning

confidence: 86%

Novel method for identifying the cause of inherent ageing in Electron Multiplying Charge Coupled Devices

et al. 2012

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The charge multiplication process used in the Electron Multiplying CCD (EMCCD) is subject to an ageing effect in which the gain achieved at particular avalanche potentials, gradually decreases during operation. To utilise these devices for both space and terrestrial applications where recalibration of the gain is not feasible, a comprehensive understanding of the ageing process is required.A custom automated test equipment (ATE) has been produced and used to develop the techniques required for investigating the ageing process alongside the verification of simulation work on the subject. Simulation work carried out by e2v technologies has suggested hole build-up at the Si/Si0 2 interface below one of the transfer gates. This build up of holes has now been linked with a reduction in avalanche potential in the device. A novel experimental technique has therefore been developed to determine the actual potentials within the device and thereby determine the validity of this prediction.The initial results tend to support simulation as an increase in the potential beneath one of the phases is observed.

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“…The accelerated electrons can then ionise other electrons in the silicon through impact ionisation, increasing the number of electrons in the charge packet and so increasing the signal. 11 This amplification applies to all of the electrons in the charge packet and so any dark current that has been integrated in the device will also be amplified. This has a negative effect on the noise level.…”

Section: Electron Multiplying Ccd (Em-ccd)mentioning

confidence: 99%