1999
DOI: 10.1002/(sici)1521-396x(199911)176:1<359::aid-pssa359>3.0.co;2-2
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The Low-Field Electron Mobility in Bulk AlGaN

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Cited by 16 publications
(6 citation statements)
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“…To clarify the expected performance of these materials, transport as well as device studies are critical. Though there has been recent theoretical [16]- [27] and experimental [28]- [32] work on the transport properties of the binary compounds and their related devices [33]- [35], there has been little information about the transport properties of the ternary compounds [36]. It is the purpose of this paper to provide a comprehensive Monte-Carlo-based study of the key, low field, transport parameters of the III-nitride ternary compounds useful in device level simulation.…”
mentioning
confidence: 99%
“…To clarify the expected performance of these materials, transport as well as device studies are critical. Though there has been recent theoretical [16]- [27] and experimental [28]- [32] work on the transport properties of the binary compounds and their related devices [33]- [35], there has been little information about the transport properties of the ternary compounds [36]. It is the purpose of this paper to provide a comprehensive Monte-Carlo-based study of the key, low field, transport parameters of the III-nitride ternary compounds useful in device level simulation.…”
mentioning
confidence: 99%
“…Assuming homogenous distribution of both phases the decrease in conductivity is thus expected due to the decrease in mobility of the carriers moving across the different phases [27]. Beside this, the effect of the alloy fluctuations on electron drift mobility would also be taken into account for further consideration for the low conductivity in Zn 1−x Cd x O alloy films [28].…”
Section: I-v Characteristicsmentioning
confidence: 99%
“…Therefore, we have used the value of 0.24m 0 for ZnO film with wurtzite structure [34]. The electron effective mass of Zn 0.41 Cd 0.59 O sample was determined to be 0.36m 0 by means of a linear extrapolation of the electron effective mass values [28] for the wurtzite phase with m*(ZnO) = 0.24m 0 and for the cubic phase with m*(CdO) = 0.44m 0 [35]. The values of the attempt-to-escape frequency and the capture cross-section S calculated from the curve fitting results are also given in Table 3.…”
Section: Samplementioning
confidence: 99%
“…The two-mode character of the alloy is quantified using the assumption that the dielectric function can be expressed as the sum of the polarizabilities of the two binaries AlN and InN [3] as was done for AlGaN [4]. These alloy modes have frequencies that lie in the vicinity of the LO and TO frequencies of GaN, which might suggest that they may propagate through the superlattice.…”
Section: Phononsmentioning
confidence: 99%