1976
DOI: 10.1002/pssb.2220780112
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The magnetic after‐effect spectrum in cobalt between 20 and 350 K after electron irradiation at 4.2 K

Abstract: After electron irradiation of cobalt single crystals a spectrum of magnetic after-effect processes is observed where nearly all the relaxation peaks anneal out rapidly during the measurement. For the discussion of the experimental results a survey is given of the configurations of interstitial atoms and close Frenkel pairs which can be expected for the h.c.p. lattice. Taking into account resistivity annealing experiments the relaxation process at 325 K can be attributed to a diffusion after-effect which is due… Show more

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Cited by 16 publications
(3 citation statements)
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“…One can therefore assume that in stage I11 freely migrating defects are involved. This interpretation is supported by our magnetic aftereffect ineasurenients [8] which show that the defects annealing out in stage I11 give rise to a diffusion aftereffect. From our present results we cannot decide whether stage I11 in Co can be attributed to interstitial [19] or vacancy [13,20] migrat,ion, which both can give rise to a diffusion aftereffect.…”
Section: Stage Zzzmentioning
confidence: 62%
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“…One can therefore assume that in stage I11 freely migrating defects are involved. This interpretation is supported by our magnetic aftereffect ineasurenients [8] which show that the defects annealing out in stage I11 give rise to a diffusion aftereffect. From our present results we cannot decide whether stage I11 in Co can be attributed to interstitial [19] or vacancy [13,20] migrat,ion, which both can give rise to a diffusion aftereffect.…”
Section: Stage Zzzmentioning
confidence: 62%
“…This can easily be understood, if one considers the great variety of Frenkel pairs which may exist in the h.c.p. lattice The interpretation of the recovery spectrum between 20 and 55 K by annealing of close Frenkel pairs is also suggested by our magnetic aftereffect measurements [8], with a number of relaxation processes in this temperature range which anneal out during measurement with a very few jumps of the defects involved.…”
Section: Stage Imentioning
confidence: 73%
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