The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory

Inada, Hiromi; Zhu, Y; Wall, J.; Volkov, V. V.; Nakamura, Kenzo; Konno, Mitsuru; Jarausch, Konrad; Twesten, RD

doi:10.1017/s1431927608084201

Cited by 4 publications

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“…The first aberration-corrected electron microscope from Hitachi is the HD-2700 STEM, described briefly at IMC-16 (Sapporo) in 2006 (Nakamura et al) and at Microscopy and Microanalysis in 2008 [73] and at length by Nakamura et al [133] and Inada et al [74]. This instrument incorporates a CEOS corrector.…”

Section: Hitachimentioning

confidence: 99%

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The correction of electron lens aberrations

Hawkes

2015

Ultramicroscopy

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Section: Hitachimentioning

confidence: 99%

“…Lens-field center alignment for high resolution electron microscopy. Ultramicroscopy 65,[71][72][73][74][75][76][77][78][79] O. L. Krivanek, N. Dellby and L. M. Brown (1996). Spherical aberration corrector for a dedicated STEM.…”

Section: Note On Appendices a And Bmentioning

confidence: 99%

The correction of electron lens aberrations

Hawkes

2015

Ultramicroscopy

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Chapter 12 Aberration-Corrected Electron Microscopes at Brookhaven Microscopes at Brookhaven National Laboratory

Zhu¹,

Wall²

2008

Advances in Imaging and Electron Physics

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Application of 80-200 kV aberration corrected dedicated STEM with cold FEG

Konno

Suzuki

Inada

et al. 2010

J. Phys.: Conf. Ser.

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Naka application Center, Naka Division, Nanotechnology Products Business Group, Hitachi High-Technologies, 11-1, Ishikawa-cho, Hitachinaka-shi, Ibaraki-ken, 312-0057, Japan 2 Advanced Microscope System Design 2 nd Department, Naka Division, Nanotechnology Products Business Group, Hitachi High-Technologies, 882, Ichige, Hitachinaka-shi, Ibaraki-ken, 312-8504, Japan E-mail: konno-mitsuru@naka.hitachi-hitec.com Abstract. We have developed new STEM instrumentation with a cold field emission source (Hitachi HD-2700) in order to perform structural characterization and elemental mapping at the atomic level. The instrument utilises the CEOS GmbH (Germany, managing director: Dr. Max Haider) aberration corrector. The accelerating voltage range is between 80 kV and 200 kV. The cold field emission source proves to be the ideal emitter for analytical transmission electron microscopes due to its high brightness, high current density and small energy spread. In this study, we have examined low accelerating voltage conditions for obtaining high image contrast and high performance elemental analysis (in which FWHM of zero loss peaks are 0.3 eV for acquisition time of 1 second and 0.34 eV for acquisition time of 40 second by accelerating voltage of 80 kV, respectively). We have observed high contrast bright field STEM images of graphene carbon at an accelerating voltage of 80 kV, in which lattice fringes can be clearly seen.

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The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Cited by 4 publications

References 0 publications

The correction of electron lens aberrations

The correction of electron lens aberrations

Chapter 12 Aberration-Corrected Electron Microscopes at Brookhaven Microscopes at Brookhaven National Laboratory

Application of 80-200 kV aberration corrected dedicated STEM with cold FEG

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