2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)
DOI: 10.1109/iscas.2004.1329316
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The noise immunity of dynamic digital circuits with technology scaling

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Cited by 2 publications
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“…The reasons for this are mainly the large variations in threshold voltage (ΔV th ) during production [2] and considerable static leakage current appearing in low V th transistors [3]. An interesting measure is the ratio between the supply voltage and the threshold voltage (V dd /V th ), which should be constant to maintain noise immunity [7].…”
Section: Introductionmentioning
confidence: 99%
“…The reasons for this are mainly the large variations in threshold voltage (ΔV th ) during production [2] and considerable static leakage current appearing in low V th transistors [3]. An interesting measure is the ratio between the supply voltage and the threshold voltage (V dd /V th ), which should be constant to maintain noise immunity [7].…”
Section: Introductionmentioning
confidence: 99%
“…Por lo tanto, un ruido inductivo se incrementa cuadraticamente y llega a ser más significativo con la reducción de la tecnología, que un ruido resistivo. En [21] Mendoza mostró que un adecuado compromiso de diseño entre una resistencia y una inductancia, en redes de distribución de potencia en tecnologías nano métricas permite reducir los niveles de ruido en ellas. Así mismo, Mendoza mostró que la inmunidad a ruido en circuitos digitales dinámicos disminuirá en tecnologías futuras, principalmente debido al escalado de tensión de alimentación y voltaje de umbral del dispositivo.…”
Section: Estado Del Arteunclassified