The performance and structural properties of multilayer optical filters

Lissberger, P.H.; Pearson, J.M.

doi:10.1016/0040-6090(76)90486-7

Cited by 18 publications

(2 citation statements)

References 9 publications

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“…For the OX direction, the uniform rate of change for is assumed, and the growth quantity dX is given by dX = tan ) dz = -(cm ur) dz (4) and with the substitution of Eq. (2), dx = -: V (cos w'r) th (5) So, the growth quantity X over total time T is _1_i1 sin oT ,…”

Section: Growth and Simulation Of The Thinfilmsmentioning

confidence: 99%

Method to destroy the columnar structure of optical thin films

Zhang

Fan

Zhao

et al. 1990

Modeling of Optical Thin Films II

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A method based on continuously modulating the vapor deposition angle, , in the range from 00 < < 1800 at an appropriate rate is proposed, by which the typical colunmar structure of vapordeposited thin films can be prevented in favor of a more compact structure, similar to a bulk material. The growth rates of such films are quantifed, and the their microstructure is simulated by computer. At the same time, an experimental study has been performed successfully. Lastly, the mechanism underlying these improved properties is analyzed and discussed.

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Section: Growth and Simulation Of The Thinfilmsmentioning

confidence: 99%

Method to destroy the columnar structure of optical thin films

Zhang

Fan

Zhao

et al. 1990

Modeling of Optical Thin Films II

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show abstract

“…In the early days of optical thin film depositions, nearly a century ago, it was assumed that films were vitreous and homogeneous throughout their thickness, like freezing rain. Macleod [1] and Lissberger [2] started to dispel this idea from their observations porosity and moisture absorption, and Pulker [3] and Guenther [4] further contributed to the better understanding of reality via the use of electron microscopy. It has also been known from the early days that the deposition of some films like zirconia tend to produce variations in density with increasing thickness and therefore variations in indices with layer thickness (inhomogeneity).…”

Section: Introductionmentioning

confidence: 99%

Model-free approach to finding index of refraction values of optical coatings from spectral measurements

Willey

2023

Appl. Opt.

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Mathematical models for fitting the refractive index versus the wavelength, such as the Cauchy, Sellmeier, and Drude equations, or physical models, such as the Lorentz model, are commonly used to fit the index properties of measured spectra of optical thin film witness samples for use in the design and production of optical interference coatings. The degree of agreement of the coating reflectance and transmittance with the design when the coatings are produced with these data will depend on the accuracy of the spectral measurements and index fittings. As thin-film coating technology has progressed, many cases are now encountered where no simple model is adequate to fit the actual index dispersion. This work shows an approach to finding the refractive index versus wavelength, which is independent of any mathematical or physical models.

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Some Fundamentals of Optical Thin Film Growth

Kaiser

2003

Optical Interference Coatings

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The performance and structural properties of multilayer optical filters

Cited by 18 publications

References 9 publications

Method to destroy the columnar structure of optical thin films

Method to destroy the columnar structure of optical thin films

Model-free approach to finding index of refraction values of optical coatings from spectral measurements

Some Fundamentals of Optical Thin Film Growth

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