The photoconductivity σph of hydrogenated amorphous silicon measured in experiments has a power law dependence on the carrier generation rate G: σph∝Gγ. The exponent γ is often interpreted as a measurement of the density of states distribution in the upper half of the band gap. This paper reports the numerical modeling of the dependence of the photoconductivity on the carrier generation rate. Examination of the traditional closed form solution shows that for the important case of γ close to unity, numerical modeling is required. The results of such numerical modeling show that γ is more sensitive to the total number of gap states rather than the distribution of states. A γ close to unity is better interpreted as a supplementary indication of low total defect density in the upper half of the band gap, instead of a certain distribution of these states.