The photon‐ion merged‐beams experiment PIPE at PETRA III—The first five years

Abstract

The Photon-Ion Spectrometer at PETRA III -in short, PIPE -is a permanently installed user facility at the "Variable Polarization XUV Beamline" P04 of the synchrotron light source PETRA III operated by DESY in Hamburg, Germany. The careful design of the PIPE ion-optics in combination with the record-high photon flux at P04 has lead to a breakthrough in experimental studies of photon interactions with ionized small quantum systems. This short review provides an overview over the published scientific results from photon-ion merged-beams experiments at PIPE that were obtained since the start of P04 operations in 2013. The topics covered comprise photoionization of ions of astrophysical relevance, quantitative studies of multi-electron processes upon inner-shell photoexcitation and photoionization of negative and positive atomic ions, precision spectroscopy of photoionization resonances, photoionization and photofragmentation of molecular ions and of endohedral fullerene ions.

Multiple photodetachment of silicon anions via K -shell excitation and ionization

“…The cross section for the direct detachment of a 1s electron is an order of magnitude smaller for Si − as compared to C − . The photon-ion merged-beams method as implemented at the PETRA III synchrotron successfully proved capable of meeting this challenge, with the high photon flux from the XUV beamline P04 and the high product selectivity of the PIPE setup being the key assets [23] .…”

“…The measurements were carried out using the photonion merged-beams technique [21] at the PIPE facility [22,23], which is a permanently installed end-station at the photon beamline P04 [24] of the synchrotron radiation source PETRA III operated by DESY in Hamburg, Germany. Silicon anions were produced by a Cs-sputter ion source [25] with a silicon single crystal as a sputter target and a sputter potential of about 2 kV.…”

Absorption spectra at the iodine 3d ionisation threshold following the CHxI+ (x = 0–3) cation sequence

“…The experiments were carried out at the ion beamline facility PIPE at P04, PETRA III, DESY, using accelerated beams of CH x I + (x = 0-3) molecular ions. Details of the set-up and operation of PIPE [57][58][59] and of the photon beamline P04 60 have been discussed previously. The ion preparation and the beamline parameters for the soft X-ray photons delivered by P04 are chosen as described in the context of the IH + experiment.…”

The In Situ Ion Irradiation Toolbox: Time-Resolved Structure and Property Measurements

“…Beyond electron microscopy, the evolution of surface composition and structure can continue to be explored via a range of advanced characterization techniques. One can envision characterizing gascovered surfaces via near-ambient pressure XPS, 133 integrating an ion beam with a synchrotron light source, 134 re-igniting prior in situ irradiation Scanning Tunneling Microscopy (STM) 135,136 and Atom Probe Tomography (APT) studies 137,138 investigations, and combining multiple IBA techniques with ion accelerators. 139 Additionally, given careful engineering considerations, in situ characterization with Secondary Ion Mass Spectrometry (SIMS), Atomic Force Microscopy (AFM), and Gas Chromatography Mass Spectrometry (GCMS) can be envisioned.…”