The physico-chemical properties of methylphenulsiloxane copolymers

Андрианов, К. А.; Slonimskii, G.L.; Zhdanov, A. A.; Levin, V.Yu.; Tsvankin, D.Ya.; Kvachev, Yu.P.; Obolonkova, Ye.S.; Макарова, Н. Н.; Mukbaniani, O.; Belavtseva, Ye.M.

doi:10.1016/0032-3950(77)90185-x

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“…The first halo was narrow and similar to the first reflection in the X-ray diffraction pat- tern of crystalline octaphenyloctasilsesquioxane at 2 θ 6 .5°-8° [3], which corresponds to the interchain distance from PPSSO blocks ( d 2 ~ 11 Å). The results obtained in this work are consistent with published data [1][2][3]6]. The diffraction patterns of PDMS in an initial state represent a diffuse halo with a distance that corresponds to the distances of PDMS blocks (d 1 = 7.3 Å) and a PDMS homopolymer [1,6].…”

Section: Resultssupporting

confidence: 94%

“…Block copolymers with various ratios between PDMS and polyphenylsilsesquioxane (PPSSO) blocks were studied. It was found that, depending on the value of PDMS blocks, the polymers were either 20 : 5 and 20 : 10 multiblock copolymers or 40 : 10, 40 : 20, and 80 : 40 diblock copolymers, which mainly consisted of a pair of a flexible PDMS block and a rigid PPSSO block [1][2][3]. It was noted that siloxane diblock copolymers differed from multiblock copolymers in many characteristics, for example, supramolecular structure.…”

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confidence: 99%

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An X-ray Diffraction Study of γ-Irradiated Siloxane Block Copolymers

2005

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It was found that 20 : 5 and 40 : 10 siloxane block copolymers of the general formula {( CH 3 ) 2 SiO } m {[ C 6 H 5 SiO 1.5 ] a [ C 6 H 5 SiO · ( OH )] 1 -a } n are structurally different: the 20 : 5 siloxane block copolymers consisted of 8-10 pairs of blocks, whereas the 40 : 10 siloxane block copolymers consisted of 1-2 pairs of blocks. The diffraction patterns of the initial 20 : 5 siloxane block copolymers were characterized by two reflections with 2 θ maximums at 7.7° and 12.2° , whereas the diffraction patterns of the initial 40 : 10 siloxane block copolymers were characterized by a reflection with a 2 θ maximum of ~8.3 ° . After irradiation to a dose higher than the dose of gelation (~100 kGy), two reflections with maximums at ~7.6° and 12.5° appeared in the diffraction pattern of 40 : 10 siloxane block copolymers. This suggests a structural rearrangement and offers possibilities for the radiation crosslinking and regulation of the supramolecular structure of block copolymers.

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Section: Resultssupporting

confidence: 94%

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confidence: 99%