The Proton‐induced kossel effect and its application to crystallographic studies

Abstract

A survey is given of the characteristic features of the proton-induced Kossel effect and its use for crystallographic investigations of semiconductor materials. The excitation of t h e characteristic X-rays was performed with protons in the energy range 0.5 -1.5 MeV. Mainly long-wave X-radiation was used because of t h e high X-ray yields and large Bragg angles also for reflections with low indices. The use of the effect for lattice parameter determinations, t h e identification of polar surfaces and the detection of tetragonal distortions is described. I n this connection the advantage of simultaneously recording Kossel reflection and blocking pattern is also demonstrated. The different behaviour of the observed P-Ka-and Ga-Ka-reflections in response t o lattice damage is pointed out. Es werden die spezifischen Merkniale des protoneninduzierten Kosseleffektes untl seineAnwendung fur kristallographische Untersuchungen a n Halbleitermaterialien dargestellt. Die Anregung tier charakteristischen Rontgenstrahlung erfolgte rnit Protonen der Energie 0,5 -1,5 MeV. Hauptsiichlich wurde relativ langwellige Rontgenstrahlung genutzt, da hierbei einerseits hohe Riintgenausbeuten und aridererseits groBe Braggwinkel auch fur niedrig indizierter Reflexe auftreten. So erfolgten Gitterkonstantenbestimmungen, Ideritifizierungen von polaren Oberfliichen und der anschauliche Nachweis von tetragonalen Verzerrungen. In diesem Zusamrnenhang werden die Vorteile der gleichzeitigen Aufnahrne vou Kosselreflex und Protonogramm diskutiert. Weiterhin wird das unterschiedliche Verhalten tier beobachteten P-Ka-und Ga-Ka-Reflexe gegenuber St.orungen der Kristallstruktur beschrieben.

Theoretical Investigation of the Lattice Thermal Conductivities of II–IV–V2 Pnictide Semiconductors

“…Comparison of experimental − and DFT-calculated values of (a) a and (b) c lattice parameters. Black solid line represents perfect agreement.…”

Ion‐Induced Characteristic X‐Ray Emission in Solids

“…As already mentioned in Section 3.2, the diffraction of particle-induced X-rays by the crystal lattice can also be used for material analysis. Geist and Ascheron have demonstrated that the proton-induced Kossel effect can be applied to crystallographic studies [136]. Especially the lattice parameter determination of binary and ternary compounds is described and the influence of proton irradiation and thermal expansion is investigated.…”