2002
DOI: 10.1016/s0304-8853(02)00468-7
|View full text |Cite
|
Sign up to set email alerts
|

The quest for fast phase change materials

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
8
1

Year Published

2006
2006
2013
2013

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 23 publications
(9 citation statements)
references
References 12 publications
0
8
1
Order By: Relevance
“…The most frequently used rewritable phase-change recording materials, ternary GeSbTe and quaternary AgInSbTe alloys, belong to the group of semiconductor chalcogenides [1,4,5]. However, other compounds are subject of continuous investigation for optical recording media [4].…”
Section: Introductionmentioning
confidence: 99%
“…The most frequently used rewritable phase-change recording materials, ternary GeSbTe and quaternary AgInSbTe alloys, belong to the group of semiconductor chalcogenides [1,4,5]. However, other compounds are subject of continuous investigation for optical recording media [4].…”
Section: Introductionmentioning
confidence: 99%
“…However, in nucleation-dominated materials, recrystallization initiates both within the interior (nucleation) and from the edge (growth) (Figure 3). The two most important factors governing nucleation and growth kinetics are temperature and local material composition [16][17][18][19][20]. For any given composition, the crystal growth speed may vary dramatically (by more than 10 orders of magnitude) between room temperature and melting temperature [21].…”
Section: Physics Of Pcmmentioning
confidence: 99%
“…Applications in phase-change memories [1,2] and in detectors for medical imaging [3] and electron beam (EB) lithography seem most remarkable. Today the study of interaction between ChG and EB is an actual task; a number papers have been published on EB induced reliefs in stoichiometric [4] and non-stoichiometric [5,6] As-S thin films, experimental results on electron beam induced reliefs in Ge-Se [7], Sb-S [8] and Sb-Se [9] thin films, investigation of recording on Se/As 2 S 3 and Sb/As 2 S 3 nanolayered structures [10].…”
Section: Introductionmentioning
confidence: 99%