2019
DOI: 10.3390/mi10070491
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The Role of ALD-ZnO Seed Layers in the Growth of ZnO Nanorods for Hydrogen Sensing

Abstract: Hydrogen is one of the most important clean energy sources of the future. Because of its flammability, explosiveness, and flammability, it is important to develop a highly sensitive hydrogen sensor. Among many gas sensing materials, zinc oxide has excellent sensing properties and is therefore attracting attention. Effectively reducing the resistance of sensing materials and increasing the surface area of materials is an important issue to increase the sensitivity of gas sensing. Zinc oxide seed layers were pre… Show more

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Cited by 9 publications
(8 citation statements)
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“…25 Lu et al observed lower GPC values for higher Ar flow rates during the purge. 26 Based on these results, we suspect that partial loss of surface hydroxyl groups would occur more significantly during long H 2 O purges, resulting in the lower GPC value. The thickness of the ZnO films was determined by using an FS-1 multiwavelength ellipsometer.…”
Section: Introductionmentioning
confidence: 82%
“…25 Lu et al observed lower GPC values for higher Ar flow rates during the purge. 26 Based on these results, we suspect that partial loss of surface hydroxyl groups would occur more significantly during long H 2 O purges, resulting in the lower GPC value. The thickness of the ZnO films was determined by using an FS-1 multiwavelength ellipsometer.…”
Section: Introductionmentioning
confidence: 82%
“…As it is known, atomic layer deposition (ALD) and chemical vapor deposition (CVD) are widely used for a large-scale production of thin films for electronic and optoelectronic device applications. In particular, ALD has been employed for forming a large range of metal oxide films including ZnO [198][199][200]. In the process, chemical precursor reactants (e.g., diethylzinc and water vapor) are alternatively introduced into the growth chamber, and react sequentially on desired substrate surfaces to form nano-ZnO films of uniform and reproducible thickness, even at low deposition temperatures of 25-300 • C [199,200].…”
Section: Vapor Phase Routementioning
confidence: 99%
“…In particular, ALD has been employed for forming a large range of metal oxide films including ZnO [198][199][200]. In the process, chemical precursor reactants (e.g., diethylzinc and water vapor) are alternatively introduced into the growth chamber, and react sequentially on desired substrate surfaces to form nano-ZnO films of uniform and reproducible thickness, even at low deposition temperatures of 25-300 • C [199,200]. Recently, 1D-ZnO nanostructures have received considerable attention because of their potential applications in advanced optoelectronic devices.…”
Section: Vapor Phase Routementioning
confidence: 99%
“…In optoelectronics, various ZnO nanostructures are used for producing e.g., refractive index sensors [ 123 ], surface-enhanced Raman scattering (SERS) sensors [ 124 ], lasers, UV detectors, and UV diodes [ 74 , 125 , 126 , 127 , 128 ]. ZnO nanostructures may serve for producing sensors of gases [ 129 , 130 , 131 , 132 , 133 , 134 , 135 , 136 , 137 , 138 , 139 , 140 , 141 , 142 , 143 , 144 , 145 , 146 , 147 , 148 , 149 , 150 , 151 , 152 ] such as steam (humidity, H 2 O) [ 133 ], ammonia (NH 3 ) [ 129 , 130 , 131 , 143 ], nitrogen (N 2 ) [ 131 ], nitrogen monoxide (NO) [ 129 , 130 , 139 ], nitrogen dioxide (NO 2 ) [ 129 , 131 , 134 , 135 , 136 ,…”
Section: Introductionmentioning
confidence: 99%