“…Another one and more seldomly used strategy in nanoanalytics is to combine several functions in one methodology [98,99]. Thus, the tandem of several techniques and appropriate optimized methodologies, i.e., scanning electron microscopy (SEM) coupled with energy dispersive X-ray microanalysis (EDX), transmission electron microscopy (TEM), atomic force microscopy (AFM), etc., can be readily applied at once for analysis of OInH to get closer insights on the nature of the redistricted analytical signals from the targeted nano-objects [97].…”