1973
DOI: 10.1080/14786437308228001
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The role of oxygen transport in oxidation of Fe-Cr alloys

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Cited by 44 publications
(13 citation statements)
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“…Angle resolved diffraction determined that the Fe x+1 Cr 2Àx O 4 concentration increased with distance from the metal oxide interface while (Cr,Fe) 2 O 3 remained fairly constant throughout. The conclusion that oxide growth occurs via cation transport from the metal/ oxide interface is consistent with the O 18 marker work on Fe-Cr high temperature scales by Barnes et al [5] as well as the oxidation mechanism for Fe-Cr steels proposed by Benard [6,7].…”
Section: Introductionsupporting
confidence: 83%
“…Angle resolved diffraction determined that the Fe x+1 Cr 2Àx O 4 concentration increased with distance from the metal oxide interface while (Cr,Fe) 2 O 3 remained fairly constant throughout. The conclusion that oxide growth occurs via cation transport from the metal/ oxide interface is consistent with the O 18 marker work on Fe-Cr high temperature scales by Barnes et al [5] as well as the oxidation mechanism for Fe-Cr steels proposed by Benard [6,7].…”
Section: Introductionsupporting
confidence: 83%
“…After 1 min of re-oxidation ( Fig.4(a)), the metal/oxide interface, still defined by the maximum intensity of the Ni2signal, is located at 137.5s of sputtering time, which corresponds to 2.1 nm. By looking at both the 16 For a re-oxidation time of 15 min, the Ni2signal indicates that the metal/oxide interface is reached after 360s of sputtering, corresponding to a total oxide layer thickness of 5.4 nm. The oxide film is clearly growing.…”
Section: Characteristic Ionmentioning
confidence: 99%
“…For 1h of re-oxidation, the oxide film thickness is 6.5 nm (corresponding to 435s of sputtering), while for a 2h re-oxidation time, the thickness of the oxide film remains nearly constant (6.8 nm, ~ 450s of sputtering time). By looking at the depth profiles of the 16 Oand 18 Osignals, one observes that the 18 Osignal still has a wide peak in the external surface and the 16 Osignal peak in the inner region for 1h re-oxidation, whereas for 2h re-oxidation, the 16 Oand 18 Odepth profiles overlap in the oxide film region, which is assigned to the the main mechanism dominating the depth profile is the 16 O/ 18 O isotopic exchange. A scheme of the evolution of the oxide layer exposed to 18 O2 at 300°C based on the ToF-SIMS depth profiling data is shown in Fig.5.…”
Section: Investigation Of Ion Transport Process In Oxide Layersmentioning
confidence: 99%
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