The role of the electronic structure in charge exchange between low energy ions and surfaces

O’Connor, D.J.; Shen, Y.G.; Wilson, J.M.; MacDonald, R.J.

doi:10.1016/0039-6028(88)90585-7

Cited by 42 publications

(1 citation statement)

References 17 publications

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“…Our experimental apparatus has been described previously (O'Connor et al 1988;Shen et al 1992). In brief, the LEIS experiments using 2 keY He+ ions were conducted in system A and a LEED pattern check of the clean Si(llO) surface was performed in system B.…”

Section: Methodsmentioning

confidence: 99%

Atomic Arrangement of the Clean Si(110) 5x1 Surface Derived by Low Energy Scattering Spectroscopy

Shen¹,

O’Connor²,

MacDonald³

1992

Aust. J. Phys.

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The atomic arrangement of the Si(llO) 5x1 reconstructed surface has been studied by low energy ion scattering. The experimentally measured incident angle scan data were compared with the results of computer simulations for various structural models. Although detailed quantitative interpretation of the full range of ion scattering data is difficult to achieve, there is clear evidence for a major reconstruction of the surface. A reasonable fit for the adatom model between the experimental results and computer simulation suggests that the clean Si(llO) 5x1 surface consists of a mixture of 5x1, 5x4 and 5x5 structures, possibly partially disordered along the [flO] direction. The different adatom and rest atom sites have been determined by fitting the calculation with the experimental data. However, there is no other existing experimental evidence, at this time, to support the adatom or rest atom height.

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Section: Methodsmentioning

confidence: 99%

Atomic Arrangement of the Clean Si(110) 5x1 Surface Derived by Low Energy Scattering Spectroscopy

Shen¹,

O’Connor²,

MacDonald³

1992

Aust. J. Phys.

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Application of low‐energy noble‐gas ion scattering to the quantitative surface compositional analysis of binary alloys and metal oxides

Oetelaar

Benthem

Helwegen

et al. 1998

Surf. Interface Anal.

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Low‐energy noble‐gas ion scattering (LEIS) probes the outermost atomic layer of a material, but a quantitative compositional analysis of this layer is not straightforward. It is demonstrated that quantification by calibration can be done, assuming that ion fractions and shielding effects are the same for the reference sample and sample of interest. These assumptions are critically evaluated and LEIS experiments on binary alloys and metal oxides are presented that can partly verify these assumptions. The LEIS measurements of a Cu–Au alloy and CuO powder as a function of initial energy indicate the absence of matrix effects in the ion fractions after scattering from the metal atoms in these systems. In metal oxides, shielding of surface metal atoms by shadowing/blocking and ion neutralization by neighbouring atoms can significantly influence the quantification of the metal atom concentration and is determined by the local atomic arrangement as illustrated by LEIS experiments of CuO and ZnO samples. © 1998 John Wiley & Sons, Ltd.

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2014

Secondary Ion Mass Spectrometry

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The role of the electronic structure in charge exchange between low energy ions and surfaces

Cited by 42 publications

References 17 publications

Atomic Arrangement of the Clean Si(110) 5x1 Surface Derived by Low Energy Scattering Spectroscopy

Atomic Arrangement of the Clean Si(110) 5x1 Surface Derived by Low Energy Scattering Spectroscopy

Application of low‐energy noble‐gas ion scattering to the quantitative surface compositional analysis of binary alloys and metal oxides

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