Defects in the core of SrLaGaO 4 single crystals, grown by the Czochralski method using a [001]-oriented seed, were studied by transmission X-ray diffraction projection topography. Topographs were taken with radiation from a laboratory source and with high-energy radiation available at the ESRF beamline ID19 in Grenoble. The contrast of the investigated defect images was analysed for various diffraction vectors g and for various values of the product 0 t ( 0 is the linear absorption coefficient and t the crystal thickness). This allowed the contrast formation to be studied as a function of absorption. The results of the analysis confirm the model of crystal lattice deformation around rod-like volume defects in SrLaGaO 4 crystals. research papers J. Appl. Cryst. (2013). 46, 48-54 Agnieszka Malinowska et al. Growth defects in SrLaGaO 4 49