The Soft X-ray to EUV Performance of Plane and Concave Pt-Si Multilayer Mirrors

Evans, B.; Al-Dabbagh, Jinan B.; Kent, B. J.

doi:10.1080/09500348914550551

Cited by 3 publications

(1 citation statement)

References 6 publications

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“…Theoretical and experimental studies on the multilayer mirrors and consequently material selection have been made by several authors [4][5][6][7]. Considering as a starting point the results obtained in the previous studies we have performed a more complete analysis of the behaviour of the different couple of materials covering the full wavelength range 30-350/~.…”

Section: -Materials Selectionmentioning

confidence: 99%

Study of the reflectivity in the XUV domain of normal-incidence multilayer mirrors

et al. 1995

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The development of multilayer optics has profound implications for soft-X-ray/UV astronomy, since it allows to extend the use of normal-incidence telescopes to cover the XUV region where lines are formed at greatly different temperatures ( 105-107 K). A multilayer mirror consists of alternating thin layers of suitable materials deposited on a substrate and its performance depends not only on the optical properties of the materials but also on the design of the multilayer. In this study we have computed the reflectivity of multilayer mirrors to select both the materials and the multilayer design to achieve the best performance in the wavelength range from 30 to 350/~. Our calculations show that high theoretical reflectivities, from 0.2 to 0.8 and relatively narrow bandpasses, from -1/~ to -30/~, can be obtained, in the wavelength range from 30 to 350/~, by a suitable choice of the materials and of the multilayer design.

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Section: -Materials Selectionmentioning

confidence: 99%

Study of the reflectivity in the XUV domain of normal-incidence multilayer mirrors

et al. 1995

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Normal Incidence Multilayer Mirrors for the Wavelength Range 2·3 to 4·6 nm

Evans

1991

Journal of Modern Optics

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The performance simulation of multilayer reflectors in soft X-ray and EUV regions

Xu¹,

Evan²

1994

Modelling Simul. Mater. Sci. Eng.

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Mathematical models of interfacial roughness and interlayer diffusion and reaction, incorporated into the multilayer matrix method, in multilayer reflectors used in soft X-ray and EUV regions are created and discussed. Simulations on typical multilayers (e.g. Pt/a-Si, Pt/a-C and Ni/a-C) have revealed that the interfacial roughness reduces the peak reflectivity of a multilayer without a change of peak position, while the interlayer diffusion and reaction not only reduce the peak reflectivity sometimes (especially when diffusion occurs) but also shift the peak position. The interlayer diffusion causes more drastic change in multilayer performance than the interlayer reaction. The simulations on 'ideal' multilayer reflectors of commonly used materials (Pt, Mo, W, Ni, Cu) in conjunction with a-Si or a-C have also led to a recommended selection guide for material combinations over the wavelengths 3

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The Soft X-ray to EUV Performance of Plane and Concave Pt-Si Multilayer Mirrors

Cited by 3 publications

References 6 publications

Study of the reflectivity in the XUV domain of normal-incidence multilayer mirrors

Study of the reflectivity in the XUV domain of normal-incidence multilayer mirrors

Normal Incidence Multilayer Mirrors for the Wavelength Range 2·3 to 4·6 nm

The performance simulation of multilayer reflectors in soft X-ray and EUV regions

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