1985
DOI: 10.1002/pssa.2210900215
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The spatial distribution of frenkel pair components created in germanium and silicon under irradiation

Abstract: The kinetics of the Frenkel pair accumulation in Ge and Si under low‐temperature γ‐ or electron‐irradiation is investigated. The essential role of ionization‐enhanced annihilation of interstitials and vacancies during irradiation is found. A drift‐diffusion mechanism of the annihilation is proposed. Under suitable conditions this process can provide nearly complete annihilation of the generated pairs. The distribution of the Frenkel pairs over the distances between their components is derived from a comparison… Show more

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Cited by 4 publications
(3 citation statements)
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“…dumbbell configuration to a tetrahedral position as a result of successive charge transfer processes. The same assumption has been made to account for the nonlinear dose dependence of the concentration of Frenkel pairs, which is observed after irradiation with gamma rays at 6.5 K (34,35). From the present calculations, activation-free migration of self-interstitials at low temperature can be explained by a SI-T 2+ ↔ SI-D 0 charge transfer process as illustrated in figure 3.…”
Section: Self-interstitialsupporting
confidence: 52%
“…dumbbell configuration to a tetrahedral position as a result of successive charge transfer processes. The same assumption has been made to account for the nonlinear dose dependence of the concentration of Frenkel pairs, which is observed after irradiation with gamma rays at 6.5 K (34,35). From the present calculations, activation-free migration of self-interstitials at low temperature can be explained by a SI-T 2+ ↔ SI-D 0 charge transfer process as illustrated in figure 3.…”
Section: Self-interstitialsupporting
confidence: 52%
“…11 sive charge transfer processes. The same assumption has been made to account for the nonlinear dose dependence of the concentration of Frenkel pairs, which is observed after irradiation with gamma rays at 6.5 K. 63,64 From the present calculations, activation-free migration of self-interstitials at low temperature can be explained by a SI-T 2+ ↔ SI-D 0 charge transfer process as illustrated in Fig. 10.…”
Section: Physical Properties Of Intrinsic Point Defectsmentioning
confidence: 58%
“…During irradiation with high energy electrons, silicon lattice atoms are displaced, resulting in the formation of Frenkel pairs. In a small fraction of these Frenkel pairs the self-interstitial and vacancy are separated far enough to become independent of each other [15]. The majority of the Frenkel pairs will however disappear in a very short time by recombination of the self-interstitial with the associated vacancy.…”
Section: Electron Irradiation Induced Point Defect Clusters In Silicomentioning
confidence: 99%