The Stability of Tellurium Films in Moist Air; A Model for Atmospheric Corrosion

Abstract

The effect of extended shelf life on the information storage capability of tellurium films on polymethylmethacrylate (PMMA) was investigated. Aging tests were performed for as long as fourteen months under various temperature and humidity conditions. The rate of change of sensitivity to the writing of information (hole formation by laser machining) was chosen as the basis on which to estimate stability quantitatively. It is suggested that aging is caused by oxidation, and a theoretical model for film oxidation as a function of temperature and relative humidity is proposed. Preliminary experimental support for the model is presented, based on the comparison of predicted and observed accelerated decay.

Carrier-transfer mechanisms and Al2O3sensors for low and high humidities

“…environment on a similar analysis. The same has been extended by Milch and Tasaico (1980) to tellurium corrosion. In summary, the principal finding of this paper is that the conduction on porous alumina surfaces can be described by two carrier mechanisms.…”

Polymer-stabilized nano-sized tellurium films by laser-induced chemical vapour co-deposition process

“…17 Thus, the decrease of the Te films archival life for data storage, due to their atmospheric corrosion, has been recognized for two decades. 18 The corrosion can be decreased through hermetic sealing, storage at elevated temperatures, or using protective overcoat layers. However, the latter constrained the ablative writing process in Te and caused inferior properties of these films.…”

Kinetics of Corrosion Defect Growth in Mo Media

“…These effects have been discussed for write once media (Ref. 10). Transport is required to remove the dissolved metal ions from the anode location and also will carry detrimental negative species (Cl" ) to the anode.…”