The effect of extended shelf life on the information storage capability of tellurium films on polymethylmethacrylate (PMMA) was investigated. Aging tests were performed for as long as fourteen months under various temperature and humidity conditions. The rate of change of sensitivity to the writing of information (hole formation by laser machining) was chosen as the basis on which to estimate stability quantitatively. It is suggested that aging is caused by oxidation, and a theoretical model for film oxidation as a function of temperature and relative humidity is proposed. Preliminary experimental support for the model is presented, based on the comparison of predicted and observed accelerated decay.

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Der Einfluß ausgedehnter Lagerung (bis 14 Monate) auf die Fähigkeit von Te‐Filmen (auf Polymethylmethacrylatsubstraten) Informationen zu speichern (Löcherbildung durch Laser‐Bearbeitung) wird als Funktion der Temp. und Luftfeuchtigkeit untersucht.