2012 13th International Conference on Electronic Packaging Technology &Amp; High Density Packaging 2012
DOI: 10.1109/icept-hdp.2012.6474558
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The study of testing scenario for a SIP microcomputer

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“…The temperature test box was used to perform detailed tests on the chip in a high-temperature environment [11]. It was found that when the ambient temperature reached 100 to 105 • C, the temperature of the Zynq die inside the SiP chip exceeded its maximum junction temperature of 125 • C. The temperature difference between ambient temperatures increases significantly in high-temperature environments.…”
Section: Test Situation Before Improvementmentioning
confidence: 99%
“…The temperature test box was used to perform detailed tests on the chip in a high-temperature environment [11]. It was found that when the ambient temperature reached 100 to 105 • C, the temperature of the Zynq die inside the SiP chip exceeded its maximum junction temperature of 125 • C. The temperature difference between ambient temperatures increases significantly in high-temperature environments.…”
Section: Test Situation Before Improvementmentioning
confidence: 99%