Transport properties of Si-δ-doped InSb grown by molecular beam epitaxy are studied. The mobility spectrum (MS) analysis made over a wide temperature range reveals three species of carriers: those associated with the bulk of the film, and electrons in quantized subbands in the δ-layer. At low temperatures the MS data are consistent with self-consistent calculations and measurements of the Shubnikov-de Haas oscillations. The far-infrared cyclotron resonance lineshapes are well described by the Drude approximation using the obtained values of subband mobilities, concentrations and effective masses.