“…The UPD of Cu on Pt(hkl) has been studied by electrochemical techniques [375][376][377][378][379][380][381][382][383][384][385][386], electroreflectance [375], radioactive labeling [387,388], IR-spectroscopy [389,390], electrochemical quartz crystal microbalance (EQCM) [391], in situ STM [389,[392][393][394][395][396], and a variety of X-ray techniques [200,385,[397][398][399][400][401], as well as ex situ UHV-methods such as LEED, AES, and XPS [389,399,[402][403][404][405][406]. Figure 21 shows a slow scan voltammogram of Cu-UPD on a high-quality [390,395,396] and SXS [408], and is in agreement with ex situ XPS and LEED investigations [389,390,402].…”