2007
DOI: 10.1109/tia.2007.900470
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The Use of Condition Maps in the Design and Testing of Power Electronic Circuits and Devices

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Cited by 21 publications
(10 citation statements)
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“…Studying the thermal response for mission profiles lasting several hundreds of seconds, would result in unrealistically long simulation times. One solution, which also is used in [2], [8] and [9], is to compute the average loss for the semiconductors, i.e. IGBT and diode, over one switching period.…”
Section: B Electrical Modelmentioning
confidence: 99%
See 1 more Smart Citation
“…Studying the thermal response for mission profiles lasting several hundreds of seconds, would result in unrealistically long simulation times. One solution, which also is used in [2], [8] and [9], is to compute the average loss for the semiconductors, i.e. IGBT and diode, over one switching period.…”
Section: B Electrical Modelmentioning
confidence: 99%
“…One solution is to use the thermal FEM calculations of the inverter power modules to derive simplified thermal models that can be used in the electro-thermal simulations [2]- [5]. In order to speed up the simulations, decrease the simulation time and reduce the required memory space, semiconductor power losses are precomputed and stored in look-up tables [2], [8], [9]. The reduced simulation time makes it possible to consider many different mission profiles with several different cooling levels within reasonable time periods.…”
Section: Introductionmentioning
confidence: 99%
“…Nevertheless, the trends of the results clearly agree. Work is currently in progress to obtain results at higher power dissipations and for varying load cycles, using a back-to-back inverter arrangement (as in [19]); this will use both infra-red measurement and temperature sense diodes integrated on to the IGBT chips.…”
Section: Experimental Validationmentioning
confidence: 99%
“…These are selected to match the motor size used in the powertrain simulation. Further details of the model are given in [7].…”
Section: B Motor Drive Modelmentioning
confidence: 99%
“…Rather than simulating device switching at every switching event, which is time-consuming, the inverter model simply accesses a look-up table of device losses [7], [8]. These losses are given as a function of the load current, duty ratio and device temperature, allowing rapid estimation of the device losses based on the switching conditions at the current time step.…”
mentioning
confidence: 99%