1969 IEEE International Solid-State Circuits Conference. Digest of Technical Papers 1969
DOI: 10.1109/isscc.1969.1154768
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The variable threshold FET: Theory and experiment

Abstract: the loss of these charges occurs very slowly at lower biases (during interrogation) or at zero bias (during storage).The equations that describe this process are A FIELD-EFFECT T R A~S I S T O H with an electrically alterable VT, constitutes a nonvolatile, easily inte rated memory element,. This alterability can be attributed to cfarge transported into the gate insulator under the influence of a suitable bias. Recently this behavior has been put on a quantitative basis involving conduction mechanisms in a two … Show more

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