The power of the angle‐resolved ion desorption technique for straightforward characterization of surfaces is demonstrated. The structural sensitivity of secondary ion desorption has led to a successful application of angle‐resolved ion sputtering yield measurements to the determination of the Cl chemical bonding structure on the Ag {100} surface. Angular distributions of the sputtered Cl− ions show that chlorine dissociates at the surface to yield a bonding state of atomic form at the room temperature. Both the polar and the azimuthal angle dependencies of the sputter intensity for Ag+ and Cl− ions reveal that the Cl adatom is chemi‐sorbed high above the topmost substrate layer of Ag atoms. At all Cl exposures, the Ag‐Cl bond is oriented along the <100> azimuth with the adsorbate occupying a C4 symmetry site, not an a‐top, a bridge, or a high symmetry site. Shadow‐cone enhanced ion desorption spectra show that die geometrical structure of the Cl chemisorbed surface changes slightly as the exposure is increased.