Theory of electrical breakdown during formation of barrier anodic films

Ikonopisov, S.

doi:10.1016/0013-4686(77)80042-x

Cited by 356 publications

(156 citation statements)

References 31 publications

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“…4,7,40,43,44 The electron avalanche mechanism occurs as follows. (1) (4) This process is repeated to produce an electron avalanche.…”

Section: Resultsmentioning

confidence: 99%

“…It is thought that the former breakdown mechanism is applicable in very high concentration organic solvents such as ILs. Since the ease of electron pouring by dissociation depend on the electrolyte anion, 9,44,45 the dielectric breakdown voltage may greatly change with the type of anion molecule in the IL. When an electrolyte anion is inserted in the Al 2 O 3 layer (see Fig.…”

Section: Resultsmentioning

confidence: 99%

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Anodization Behavior of Aluminum in Ionic Liquids with a Small Amount of Water

et al. 2013

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We investigated the anodic oxidation of aluminum in ionic liquids (ILs) by the constant-voltage rising rate (C-V) method and constant-current density (C-C) method, with characterization by X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The structure of the oxide layer and the reaction efficiency varied with the type of IL, the applied voltage, the forming method, and the water content. A homogeneous Al 2 O 3 film with a superior dielectric property was formed by the C-V method (100 mV/s) in 1-butyl-3-methylimidazolium benzoate (BMIm-BEN, water content 0.81 wt%) at 40 V. Although a homogeneous barrier-type Al 2 O 3 film was also formed in 1-butyl-3-methylimidazolium mandelate (BMIm-MAN, water content 0.34 wt%) at 40 V, some anion species existed in the film, and its jump-voltage characteristics was inferior to that of the film formed in BMIm-BEN. The relative permittivity of the film formed in BMIm-BEN was almost equal to that of the Al 2 O 3 film formed in adipate (1.0 wt%) aqueous solution, but the dielectric constant of the film formed in BMIm-MAN was 1.5 times larger. In contrast, a heterogeneous porous Al 2 O 3 film containing a large amount of anion molecules was formed in 1-ethyl-3-methylimidazolium acetate (EMIm-ACE, water content 0.79 wt%) at 40 V. Since the source of oxygen for anodic oxidation is the small amount of water in the ILs, the water content strongly affected the characteristics of the formed Al 2 O 3 layer.

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“…4,7,40,43,44 The electron avalanche mechanism occurs as follows. (1) (4) This process is repeated to produce an electron avalanche.…”

Section: Resultsmentioning

confidence: 99%

Section: Resultsmentioning

confidence: 99%

Anodization Behavior of Aluminum in Ionic Liquids with a Small Amount of Water

et al. 2013

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“…The sequence illustrated in the entire figure refers to the oxide film formation and dissolution, which elucidates the observed low anodizing rate [4]. The pores are scattered by the sample surface, covering it completely, presumably by the increase of current density values [11]. besides imperfections, the formation of pores, like pits on the niobium surface.…”

Section: Resultsmentioning

confidence: 75%

Obtaining Niobium Oxides in Acetic Acid With Addition of Hf

Marcolin¹,

Longhi²,

Caio³

et al. 2018

Tecnologia Em Metalurgia Materiais E Mineração

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During anodizing, the chemical attack of hydrofluoric acid (HF) electrolytes on niobium can promote the formation of oxides with porous structures. However, this chemical attack can also cause an intense dissolution of the oxide during its formation. This effect can be minimized by varying the HF concentration of the anodizing electrolyte, thereby controlling the growth of the porous oxide. Studies have alternative electrolytes that do not use HF to obtain porous oxides. Thus, organic electrolytes, such as acetic acid, may be a viable alternative. In this context, the objective of this study is to obtain and evaluate the anodization of niobium in acetic acid at different current densities (10, 20 and 50 mA/cm 2 ) and to study the influence of the addition of HF to the electrolyte. The results showed that the anodized anodic in acetic acid, under conditions of 100 V and 10 mA/cm 2 , presented porous oxide with less defects. Therefore, this result indicates that it is possible to produce porous niobium oxides by anodizing in HF-free electrolyte. Keywords: Niobium; Anodizing; Acetic acid. OBTENÇÃO DE ÓXIDOS DE NIÓBIO EM ÁCIDO ACÉTICO COM ADIÇÃO DE HF ResumoDurante a anodização, o ataque químico de eletrólitos de ácido fluorídrico (HF) sobre o nióbio pode promover a formação de óxidos com estruturas porosas. Contudo, este ataque químico pode causar uma intensa dissolução do óxido durante sua formação. Esse efeito pode ser minimizado variando-se a concentração de HF do eletrólito de anodização, controlando assim o crescimento do óxido poroso. Estudos têm buscado por eletrólitos alternativos que não utilizam HF na obtenção de óxidos porosos. Logo, eletrólitos orgânicos, como o ácido acético, podem ser uma alternativa viável. Neste contexto, o objetivo deste estudo é obter e avaliar a anodização de nióbio em ácido acético em diferentes densidades de correntes (10, 20 e 50 mA/cm2 ) e estudar a influencia da adição de HF ao eletrólito. Os resultados mostraram que a amostra de nióbio anodizada em ácido acético, nas condições de 100 V e 10 mA/cm 2 , apresentou óxido proroso com menor quantidade de defeitos. Portanto, este resultado indica que é possível a formação de óxidos de nióbio porosos por anodização em eletrólito livre de HF. Palavras-chave: Nióbio; Anodização; Ácido acético.

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“…For a good capacitor operating nominally this current is not significant, but it becomes larger as the oxide layer degrades during operation. High electrical stress is known to accentuate the degradation of the oxide layer due to localized dielectric breakdowns on the oxide layer 16,17 . These breakdowns, which accelerate the degradation, have been attributed to the duty cycle, i.e., the charge/discharge cycle during operation 16,18 .…”

Section: A Physical Interpretation Of the Failures Due To Electricalmentioning

confidence: 99%

Towards Prognostics of Electrolytic Capacitors

Celaya

Kulkarni²,

Biswas

et al. 2011

Infotech@Aerospace 2011

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A remaining useful life prediction algorithm and degradation model for electrolytic capacitors is presented. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management research. Prognostics provides a way to assess remaining useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. In particular, experimental results of an accelerated aging test under electrical stresses are presented. The capacitors used in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This preliminary remaining life prediction algorithm serves as a demonstration of how prognostics methodologies could be used for electrolytic capacitors. Nomenclature Cp= Pristine state measured capacitance ESR = Equivalent series resistance of the electrolytic capacitor ESRp = Pristine state measured equivalent series resistance C k = Measured capacitance at time t k . RUL = Remaining Useful Life

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Theory of electrical breakdown during formation of barrier anodic films

Cited by 356 publications

References 31 publications

Anodization Behavior of Aluminum in Ionic Liquids with a Small Amount of Water

Anodization Behavior of Aluminum in Ionic Liquids with a Small Amount of Water

Obtaining Niobium Oxides in Acetic Acid With Addition of Hf

Towards Prognostics of Electrolytic Capacitors

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