1987
DOI: 10.1109/irps.1987.362186
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Thermal Fatigue Reliability of SMT Packages and Interconnections

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Cited by 20 publications
(2 citation statements)
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“…Similar results are presented in[8]. However, when keeping the same devices and lead frames but changing the substrate material from FR-4 to Kevlar, large increases in solder joint EPEQ values occur.…”
supporting
confidence: 80%
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“…Similar results are presented in[8]. However, when keeping the same devices and lead frames but changing the substrate material from FR-4 to Kevlar, large increases in solder joint EPEQ values occur.…”
supporting
confidence: 80%
“…For this, the lead frame CTE was varied at each of the four lead frame moduli. From previous SOT-23 experience [2], as well as other finite element work [8], a minimum CTE of 5 ppm/"C, approximately that of Kovar, was chosen. The maximum value was chosen to exactly match that of 60/40 solder, 24 ppm/"C. Additionally, intermediate CTE's of 10 ppm/"C and 20 ppm/"C were executed to confirm the output pattems.…”
Section: Models and Proceduresmentioning
confidence: 99%