However, due to the transient effects that are, to a large extent, a result of the ionic nature of perovskite materials, the characterization of perovskite optoelectronic devices is often sensitive to the applied measurement protocols. [11,12] This makes it difficult to compare and reproduce the reported device characteristics from different research groups, especially when the protocols are not well described. In the case of perovskite solar cells, it has been shown that the anomalous hysteresis effect, which is highly dependent on the voltage scan rate, range, direction, as well as the device structure, could significantly influence current density-voltage (J-V) characteristics and the reported power conversion efficiency (PCE) value. [13] This has triggered intensive studies on the origin of the device hysteresis and wide discussions on how to report the perovskite solar cell characteristics, leading to clear standards that are broadly followed by the perovskite photovoltaic field. [14] However, much less attention was given to the sensitivity of PeLED characteristics to their measurement protocols, which urged a discussion about the standardization of measurement procedures, and about the best practices for characterization. [15] For PeLEDs, the current density-voltage-radiance/luminance (J-V-R/L), and the EQE-J characteristics are the main figures of merit. Although the hysteresis in J-V characteristics is to date well-understood and attributed to ion migration and interfacial charge trapping, [16-18] the influence of these transient effects and device hysteresis on the PeLED performances lacks investigation. Zhao et al. have shown that under electrical stress, PeLEDs showed an EQE enhancement accompanied by a reduction in the diode ideality factor. [19] This phenomenon was attributed to trap filling by excess ions which reduces nonradiative recombination. It can be observed in many PeLEDs in literature during lifetime measurements, with the stressing time spanning a wide range of timescales from few minutes to several hours. [8,20,21] In this report, we show that the electroluminescence (EL) intensity of PeLEDs changes significantly even on a timescale from 100 ms to a few seconds. Such reversible EL transients, together with the possible device degradation during measurement, could lead to severe device hysteresis, making the reported J-V-R/L and EQE-J curves highly dependent on measurement protocols. Moreover, we show that a method based on pulsed excitation with cooldown time in-between The reproducibility of results is one of the cornerstones of scientific research. However, in emerging technologies, the reported results often tend to be sensitive to the chosen measurement protocol. This can stem from measurement artifacts or from unknown complex underlying phenomena. Metal halide perovskites have emerged as an exciting material system for optoelectronic devices. The anomalous hysteresis in the current density-voltage (J-V) characteristics of perovskite solar cells has triggered wide discussions on how ...