1997
DOI: 10.1142/s0960313197000130
|View full text |Cite
|
Sign up to set email alerts
|

Thermal Model of a Component Package for System Level Applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

1997
1997
2018
2018

Publication Types

Select...
4
2

Relationship

0
6

Authors

Journals

citations
Cited by 13 publications
(2 citation statements)
references
References 0 publications
0
2
0
Order By: Relevance
“…While these tools have the capability to assess complex thermal designs in a timely manner, previous studies have identified the ongoing need to validate numerical prediction accuracy and applicability of modelling methodologies by comparison with experimental analysis [7,8]. However, where such comparisons have been undertaken [9][10][11][12][13], these have focused mainly on characterising component performance on low conductivity test PCBs based on the recognised SEMI (Semiconductor Equipment and Materials International) or JEDEC (Joint Electronic Design Engineering Council) specifications [14,15]. Both standards specify single copper trace layer PCBs, for which a suitable modelling strategy exists [9][10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…While these tools have the capability to assess complex thermal designs in a timely manner, previous studies have identified the ongoing need to validate numerical prediction accuracy and applicability of modelling methodologies by comparison with experimental analysis [7,8]. However, where such comparisons have been undertaken [9][10][11][12][13], these have focused mainly on characterising component performance on low conductivity test PCBs based on the recognised SEMI (Semiconductor Equipment and Materials International) or JEDEC (Joint Electronic Design Engineering Council) specifications [14,15]. Both standards specify single copper trace layer PCBs, for which a suitable modelling strategy exists [9][10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%
“…However, where such comparisons have been undertaken [9][10][11][12][13], these have focused mainly on characterising component performance on low conductivity test PCBs based on the recognised SEMI (Semiconductor Equipment and Materials International) or JEDEC (Joint Electronic Design Engineering Council) specifications [14,15]. Both standards specify single copper trace layer PCBs, for which a suitable modelling strategy exists [9][10][11][12][13]. However, both SEMI and JEDEC recognised that these low conductivity test PCBs no longer represent the multilayer builds currently used in many applications and recently introduced high thermal conductivity standard test PCBs [16,17].…”
Section: Introductionmentioning
confidence: 99%