2007
DOI: 10.1016/j.spmi.2007.04.038
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Thermal oxidation of n-type ZnN films made by -sputtering from a zinc nitride target, and their conversion into p-type films

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Cited by 42 publications
(26 citation statements)
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“…5. The transmittance of the as-deposited Zn x N y was very low due to excess of Zn in the structure of the film [31]. After oxidation, all the samples became more transparent and their transmittance in the visible range was above 85%.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…5. The transmittance of the as-deposited Zn x N y was very low due to excess of Zn in the structure of the film [31]. After oxidation, all the samples became more transparent and their transmittance in the visible range was above 85%.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…However, it is still difficult to obtain reproducible and reliable p-type ZnO due to its intrinsic defects [10]. Recently, zinc nitride is studied as a promising material [11], and it can be transformed into p-type ZnO [12][13].…”
Section: Introductionmentioning
confidence: 99%
“…Next, they were oxidized in a horizontal tube furnace by annealing in an oxygen flow for 2 h at 500 1C. Our annealing time exceeds rapid annealing used for ZnTe films (1-25 min) [35,36] and is comparable to the long annealing (1-5 h) applied toward ZnS [44,45] and Zn x N y [46][47][48] films to assure full transformation of ZnSe into the ZnO. Thickness of ZnSe films was varied between 300 nm and 1 mm.…”
Section: Methodsmentioning
confidence: 99%