2006
DOI: 10.1063/1.2374693
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Thermal properties and degradation behavior of red-emitting high-power diode lasers

Abstract: The thermal properties and the degradation behavior of high-power broad-area diode lasers emitting at 650nm are analyzed. Imaging thermography is applied to assess the bulk temperature while the facet temperature is measured by micro-Raman spectroscopy. Although no visible facet alteration is observed, power degradation is found to be accompanied by increased temperatures at the facets. The immediate vicinity of them also turns out to be the starting point for the creation of defect networks within the quantum… Show more

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Cited by 17 publications
(12 citation statements)
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“…Absorption of laser light at these defects progressively increases the value of T facet . Thus, even for a constant power level T facet rises continuously [20,77] and the thermal runaway starts at T facet = T crit .…”
Section: Cod Threshold In Cw Operationmentioning
confidence: 99%
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“…Absorption of laser light at these defects progressively increases the value of T facet . Thus, even for a constant power level T facet rises continuously [20,77] and the thermal runaway starts at T facet = T crit .…”
Section: Cod Threshold In Cw Operationmentioning
confidence: 99%
“…1d). In other cases, even careful SEM inspection does not reveal any surface alteration [77], whereas electroluminescence patterns reveal darkened areas not far behind the seemingly unaffected facet. If COD signatures are visible at the facet, there is typically a correlation between P COD and the observed surface damage, i. e., the higher P COD the more extended the damage pattern at the facet [86,87].…”
Section: Failure Analysis Of Devices Affected By Codmentioning
confidence: 99%
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