Thermal simulation and measurement of component in avionics

Kim, Jung Kyun; Jeong, Su Heon

doi:10.1109/eptc.2018.8654343

Cited by 7 publications

(3 citation statements)

References 3 publications

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“…This very wide range was useful for measuring the extension of the blind-zone. Thanks to the mixed-signal oscilloscope, the duty cycles of the outputs of the PFD (UP and DOWN) were measured; afterwards, from the measurement results, the PFD characteristic was derived as in (1), where D UP and D DOWN are the duty cycles of the two output signals. Furthermore, the propagation delay of the reset path was also derived from the measured duty cycles, thereby characterizing the reset time, which is related to the blind-zone.…”

Section: Pfd Char = D Up − D Downmentioning

confidence: 99%

“…PFD Char = D UP − D DOWN (1) All the measurements described so far were also performed at different temperatures to analyze the behavior of the CP when employed in applications characterized by harsh environments. In particular, the die was heated to reach temperatures up to 200 • C. Since the chip prototype was heated locally, the measured performance was not influenced by the instruments or other commercial components used for the test, which worked at room temperature for every measurement performed.…”

Section: Pfd Char = D Up − D Downmentioning

confidence: 99%

“…Among these challenges, the most extreme ones are mainly related to harsh environmental phenomena, such as high temperatures, which may characterize the application environments, and the presence of radiation. Non-exhaustive examples of applications in which high temperatures undermine electronics' reliability are space, avionics, and aerospace applications, where the temperature can reach values up to 150 • C [1][2][3][4], as well as automotive and several industrial sectors, where the maximum temperature may reach 200 • C [5,6]. On the other hand, in space and aerospace environments, radiation can severely undermine electronics' reliability [7][8][9].…”

Section: Introductionmentioning

confidence: 99%

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An Integrated Charge Pump for Phase-Locked Loop Applications in Harsh Environments

Mestice,

Ciarpi,

Rossi

et al. 2024

Electronics

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Among all the functions that electronics currently perform, clock synthesis has a backbone role. Charge pump phase-locked loops (CP-PLL) are widely used to accomplish clock synthesis thanks to their versatility. One of the most critical parts of CP-PLLs is the charge pump, which greatly influences the system’s performance. Even though several high-performance charge pumps have been proposed in the past, with the quick spread of electronics in all the engineering fields, the design of such electronic devices has encountered several additional challenges dictated by external environmental conditions. Examples of these engineering sectors are space, aerospace, industrial, and automotive applications, where the charge pump has to face high environmental temperatures and radiation effects. As a consequence, its design and experimental characterization have to be performed to ensure reliability when operating in harsh conditions. However, to the best of the authors’ knowledge, no works in the literature have ever presented a complete charge pump design and characterization in such harsh environments. Therefore, to fill this gap, this paper presents a charge pump for PLL applications specifically designed to reach operating temperatures up to 200 °C and total ionizing dose levels up to 100 Mrad. All design choices have been experimentally verified and are discussed throughout the paper in detail. With the proposed design, we obtained an output current variation of less than 8% at 200 °C and less than 2.5% at 100 Mrad. As opposed to the CPs that can be found in the literature, these results were measured on silicon. The performed measurements confirm that the current variation at 200 °C is better than that of the state-of-the-art CPs operating at lower temperatures, which, moreover, were only simulated.

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Section: Pfd Char = D Up − D Downmentioning

confidence: 99%

Section: Pfd Char = D Up − D Downmentioning

confidence: 99%