“…The standard deviations of both hA k i and the fraction of intergranular space are relatively big, despite the large number of grains/voids analyzed, as the corresponding distributions are quite broad and asymmetric. In addition, the SEM micrographs suggest that the intergranular channels become not only larger but also deeper with increasing L. Growth of columns, perpendicular to the substrate, was also observed in Ni/Ru [19], Ag/ Cu [25], Ni 80 Fe 20 /Cu [26], NiFe/Ag [27] as well as Co/Cu [28] MLs, for example. The width of the columns close to the surface increases from 18 AE 5 nm for the [Ru 1 nm/Al 1.24 nm] 80 ML to 50 AE 12 nm for the MLs with L !…”