2021
DOI: 10.1088/2515-7639/abd4f2
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Thermal stability of monolayer WS2 in BEOL conditions

Abstract: Monolayer tungsten disulfide (WS2) has recently attracted large interest as a promising material for advanced electronic and optoelectronic devices such as photodetectors, modulators, and sensors. Since these devices can be integrated in a silicon (Si) chip via back-end-of-line (BEOL) processes, the stability of monolayer WS2 in BEOL fabrication conditions should be studied. In this work, the thermal stability of monolayer single-crystal WS2 at typical BEOL conditions is investigated; namely (i) heating temper… Show more

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Cited by 10 publications
(9 citation statements)
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“…Generally, the E′ peak in WS 2 merges with the 2LA(M) peak and together, they construct a high-intensity single peak. 32 In the case of the WS 2 region, E′ was found at ∼349.36 cm −1 and A 1 ′ at ∼417.99 cm −1 , which are close to the literature values reported by S. Pak and co-workers. 33 For the MoS 2 edge region, E′ was found at ∼383.02 cm −1 and A 1 ′ at ∼408.02 cm −1 .…”
Section: Resultssupporting
confidence: 89%
“…Generally, the E′ peak in WS 2 merges with the 2LA(M) peak and together, they construct a high-intensity single peak. 32 In the case of the WS 2 region, E′ was found at ∼349.36 cm −1 and A 1 ′ at ∼417.99 cm −1 , which are close to the literature values reported by S. Pak and co-workers. 33 For the MoS 2 edge region, E′ was found at ∼383.02 cm −1 and A 1 ′ at ∼408.02 cm −1 .…”
Section: Resultssupporting
confidence: 89%
“…Typically, the semiconducting channels must undergo baking steps at the BEOL, which temperatures as high as 300 °C. [ 61 ] Currently, no polymer system has been shown to sustain such conditions, posing a challenge for integrating organic‐based synaptic devices in advanced circuits. The bottleneck stems from the fact that to enable ion insertion, polar and bulky sidechains are employed.…”
Section: Resultsmentioning
confidence: 99%
“…0.85). Laser power was ∼1mW and the typical acquisition time was 4 s. 62 Transport measurements were performed in a vacuum chamber using source-measure units K4200 and K2614B and a Femto DDPCA-300 current preamplifier.…”
Section: Methodsmentioning
confidence: 99%