The excitation of plasmonic nanoparticles by ultrashort laser pulses sets in motion a complex ultrafast relaxation process involving the gradual re-equilibration of the system's electron gas, lattice and environment. One of the major hurdles in studying these processes is the lack of direct measurements of the dynamic temperature evolution
Excitons dominate
the light absorption and re-emission spectra
of monolayer transition-metal dichalcogenides (TMD). Microscopic investigations
of the excitonic response in TMD almost invariably extract information
from the radiative recombination step, which only constitutes one
part of the picture. Here, by exploiting imaging spectroscopic ellipsometry
(ISE), we investigate the spatial dependence of the dielectric function
of chemical vapor deposition (CVD)-grown WS2 flakes with
a microscopic lateral resolution, thus providing information about
the spatially varying, exciton-induced light absorption in the monolayer
WS2. Comparing the ISE results with imaging photoluminescence
spectroscopy data, the presence of several correlated features was
observed, along with the unexpected existence of a few uncorrelated
characteristics. The latter demonstrates that the exciton-induced
absorption and emission features are not always proportional at the
microscopic scale. Microstructural modulations across the flakes,
having a different influence on the absorption and re-emission of
light, are deemed responsible for the effect.
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