2015
DOI: 10.1049/iet-pel.2014.0152
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Thermal test method for high power three‐phase grid‐connected inverters

Abstract: Semiconductor device junction temperatures are maintained within datasheet specified limits to avoid failure in power converters. Burn-in tests are used to ensure this. In inverters, thermal time constants can be large and burn-in tests are required to be performed over long durations of time. At higher power levels, besides increased production cost, the testing requires sources and loads that can handle high power. In this paper, a novel method to test a high power three-phase grid-connected inverter is prop… Show more

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Cited by 4 publications
(2 citation statements)
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“…The grid angle is used to transform the grid currents and voltages from a-b-c reference frame to d-q reference frame by Park transformation as given in Eqn. (1). The error is calculated from the reference and measured d-q currents, and the errors in dq frame are given to PI regulators.…”
Section: Design Of the Invertermentioning
confidence: 99%
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“…The grid angle is used to transform the grid currents and voltages from a-b-c reference frame to d-q reference frame by Park transformation as given in Eqn. (1). The error is calculated from the reference and measured d-q currents, and the errors in dq frame are given to PI regulators.…”
Section: Design Of the Invertermentioning
confidence: 99%
“…This expected to be achieved through establishing grid-connected wind farms and solar Photovoltaic (PV) systems. [1]. Most of renewable energy technology produces a DC power output.…”
Section: Introductionmentioning
confidence: 99%