Thermally Induced Strains in Evaporated Films

Vook, R.W.; Witt, F.

doi:10.1063/1.1714442

Cited by 171 publications

(75 citation statements)

References 4 publications

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“…Previous works achieved on similar structures suggested that extreme direction-dependent homogenization procedures such as the Vook-Witt model (see Vook and Witt, 1968;Welzel and Fréour, 2007) gave satisfying results on both in-plane and out-of-plane behaviour. A similar mixed homogenenization is thereby suggested, where the inplane behaviour is modeled using the stress-based formulation, whereas the strain-based formulation is used for the out-of-plane behaviour.…”

Section: Mixed Formulation and Resultsmentioning

confidence: 99%

On the validity of the self-consistent scale transition model for inclusions with varying morphologies

Lacoste

Fréour

Jacquemin

2010

Mechanics of Materials

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Scale transition models based on Eshelby's solution provide interesting information on the properties and multi-scale mechanical states experienced by materials presenting complex microstructures, such as composite materials, accounting for the constituents' properties but also microstructural parameters such as the morphology of the heterogeneous inclusions constituting the material. Nevertheless, until now, these approaches cannot reliably account for multiple inclusion morphologies in the same representative elementary volume of the modeled material, as they predict two distinct sets of properties depending of the quantities (strains or stresses) used to formulate the homogenization procedure.The present work aims to investigate the validity of Kröner-Eshelby self-consistent model for thermo-elastic behaviour, in the case when several morphologies do coexist within the same representative elementary volume. A study of the two resulting formulations and their limits leads to suggest a mixed formulation inspired of Vook-Witt's model, as an understandable but acceptable compromise between the two alternatives. The results of this formulation are also described in the case of a thermo-mechanical load.

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Section: Mixed Formulation and Resultsmentioning

confidence: 99%

On the validity of the self-consistent scale transition model for inclusions with varying morphologies

Lacoste

Fréour

Jacquemin

2010

Mechanics of Materials

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“…XEC depend on the crystallographic direction (hk ) and can be derived from single-crystalline elastic constants using a proper microstructure model [12]- [14]. In particular cases, the residual stress can be treated as being biaxial (σ 13 = σ 23 = σ 33 = 0).…”

Section: Polycrystalline Thin Filmsmentioning

confidence: 99%

X-Ray Diffraction and X-Ray Reflectivity Applied to Investigation of Thin Films

Rafaja

Advances in Solid State Physics

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Abstract. An overview of X-ray scattering methods used for analysis of the real structure of thin films is presented that includes conventional diffraction, glancing angle X-ray diffraction, X-ray reflectivity measurement and grazing incidence Xray diffraction. The capability of the above techniques is illustrated on two typical examples: investigation of real structure of polycrystalline thin films and study of interface morphology and atomic ordering in periodic multilayers.

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“…as suggested by Vook and Witt in [43]. The substitution of s (2) yielded the following dependence of the measured lattice parameters on sin 2 w and on the crystallographic direction (G):…”

Section: Crystal Anisotropy Of the Lattice Deformationmentioning

confidence: 99%

Magnetic response of (Cr,Al,Si)N nanocrystallites on the microstructure of Cr—Al—Si—N nanocomposites

Rafaja¹,

Wüstefeld

Kutzner

et al. 2010

Zeitschrift für Kristallographie

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Cathodic arc evaporation / Unbalanced magnetron sputtering / High power impulse magnetron sputtering / X-ray diffraction / Transmission electron microscopy / Ab initio calculations Abstract. A combination of microstructure analysis and ab initio calculations helped us to describe the interplay between the microstructure of Cr--Al--Si--N thin film nanocomposites and the ordering of the magnetic moments in the chromium-rich phase of (Cr,Al)N. The microstructure of the Cr--Al--Si--N nanocomposites was modified through the degree of ionisation of the deposited species in three physical vapour deposition processes -cathodic arc evaporation, unbalanced magnetron sputtering and high power impulse magnetron sputtering. According to the results of the ab initio calculations, the magnetic ordering was concluded from the expansion of the elementary cell and from the change of the crystal anisotropy of the elastic constants of (Cr,Al)N; these microstructure features were obtained from X-ray diffraction experiments. The microstructure of the Cr--Al--Si--N nanocomposites was furthermore characterised using the combination of X-ray diffraction and transmission electron microscopy with high resolution in order to obtain information about the phase composition of the thin films, distribution of individual elements and the crystallite size.

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Thermally Induced Strains in Evaporated Films

Cited by 171 publications

References 4 publications

On the validity of the self-consistent scale transition model for inclusions with varying morphologies

On the validity of the self-consistent scale transition model for inclusions with varying morphologies

X-Ray Diffraction and X-Ray Reflectivity Applied to Investigation of Thin Films

Magnetic response of (Cr,Al,Si)N nanocrystallites on the microstructure of Cr—Al—Si—N nanocomposites

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