“…In the vast majority of devices, copper is separated from a semiconductor surface by a diffusion barrier material. One of the most prominent materials, possessing high thermal stability, good diffusion barrier properties, and low electrical resistivity is titanium nitride, TiN. − This material can be deposited on a semiconductor substrate using such chemical vapor deposition precursors as dialkyl-amino derivatives (Ti[NR 2 ] 4 , where R = Me, Et) − and TiCl 4 ,− used in combination with NH 3 and sometimes H 2 ; however, the latter method often presents significant problems associated with chlorine contamination and formation of NH 4 Cl. The chemical and physical properties of TiN films can be controlled by manipulating the carbon content, and in fact, titanium carbonitride films, TiC x N y , have been shown to have a set of very attractive physical properties, including better conformal filling than titanium nitride. − …”