2001
DOI: 10.1002/jcc.1095
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Thermodynamics and kinetics of initial gas phase reactions in chemical vapor deposition of titanium nitride. Theoretical study of TiCl4 ammonolysis

Abstract: Thermodynamic equilibrium and kinetics of the gas-phase reaction between TiCl 4 and NH 3 have been studied computationally using results from recent quantum mechanical calculations of titanium tetrachloride ammonolysis.1 These calculations were based upon the transition state theory for the direct reactions and RRKM theory for the reactions proceeding via intermediate complex. Rate constants for the barrierless reactions were expressed through the thermodynamic characteristics of the reagents and products usin… Show more

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Cited by 14 publications
(11 citation statements)
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“…In the vast majority of devices, copper is separated from a semiconductor surface by a diffusion barrier material. One of the most prominent materials, possessing high thermal stability, good diffusion barrier properties, and low electrical resistivity is titanium nitride, TiN. This material can be deposited on a semiconductor substrate using such chemical vapor deposition precursors as dialkyl-amino derivatives (Ti[NR 2 ] 4 , where R = Me, Et) and TiCl 4 , used in combination with NH 3 and sometimes H 2 ; however, the latter method often presents significant problems associated with chlorine contamination and formation of NH 4 Cl. The chemical and physical properties of TiN films can be controlled by manipulating the carbon content, and in fact, titanium carbonitride films, TiC x N y , have been shown to have a set of very attractive physical properties, including better conformal filling than titanium nitride. …”
Section: Introductionmentioning
confidence: 99%
“…In the vast majority of devices, copper is separated from a semiconductor surface by a diffusion barrier material. One of the most prominent materials, possessing high thermal stability, good diffusion barrier properties, and low electrical resistivity is titanium nitride, TiN. This material can be deposited on a semiconductor substrate using such chemical vapor deposition precursors as dialkyl-amino derivatives (Ti[NR 2 ] 4 , where R = Me, Et) and TiCl 4 , used in combination with NH 3 and sometimes H 2 ; however, the latter method often presents significant problems associated with chlorine contamination and formation of NH 4 Cl. The chemical and physical properties of TiN films can be controlled by manipulating the carbon content, and in fact, titanium carbonitride films, TiC x N y , have been shown to have a set of very attractive physical properties, including better conformal filling than titanium nitride. …”
Section: Introductionmentioning
confidence: 99%
“…is constructed, where B is the Hermitian matrix constructed from the matrix J: (26) and c i 0 ϭ ͌ f i is the zero-order eigenvector of the matrix B. Correspondingly, the zero-order approximation 0 (0) to the lowest eigenvalue 0 is as follows: (27) This approximation to 0 is the starting point for the iterative procedure, for example…”
Section: R͑eј E͒ F͑e͒ ϭ R͑e Eј͒ F͑eј͒mentioning
confidence: 99%
“…This example is based on our recent publication 26 where the thermodynamic equilibrium and kinetics of the gas-phase reaction between TiCl 4 and NH 3 were studied computationally using the recent quantum chemical calculations of titanium tetrachloride ammonolysis. 27 Titanium nitride has a unique combination of useful properties (high hardness and melting point, good electric and thermal conductivity, chemical inertness, and excellent adherence to most metals, semiconductors, and insulators) and numerous existing and potential industrial applications.…”
Section: Ticl 4 Ammonolysis: Equilibrium Analysismentioning
confidence: 99%
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“…To calculate texture coefficient Tc, main diffraction peaks are taken into account: (111), (200), (220) and (420). Continued.For the traditional TiCl4-NH3 system, Umanskii et al[27] studied the reaction pathways involving complex formation (TiClxNHy). It was concluded that, in typical CVD conditions, only TiCl4NH3 is formed in substantial amount at low temperature.…”
mentioning
confidence: 99%