2009
DOI: 10.1016/j.optlaseng.2008.07.011
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Thermoreflectance imaging of laser diodes and VCSELs along and perpendicular to the emission direction

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Cited by 3 publications
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“…However, most of the conventional thermal measurement techniques lack the spatial resolution to measure the temperature gradient across a length scale below the micrometer. Because of their nondestructive, noncontact nature and their high spatial resolution [12], thermoreflectance microscopy [13] is one of the most suitable photothermal techniques for the study of thin films. This technique allows us to perform accurate and precise measurements.…”
Section: Introductionmentioning
confidence: 99%
“…However, most of the conventional thermal measurement techniques lack the spatial resolution to measure the temperature gradient across a length scale below the micrometer. Because of their nondestructive, noncontact nature and their high spatial resolution [12], thermoreflectance microscopy [13] is one of the most suitable photothermal techniques for the study of thin films. This technique allows us to perform accurate and precise measurements.…”
Section: Introductionmentioning
confidence: 99%
“…Non-invasive techniques such as thermoreflectance [10][11][12], fluorescent thermometry [13][14][15][16][17], Raman thermometry [18][19][20], optical interferometry [2] and transmission electron microscopy [21] can achieve a submicron spatial resolution. However, most have very specific requirements that make them effective only under limited conditions [7,22,23].…”
Section: Introductionmentioning
confidence: 99%