Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films

Araújo, E. B.; Lima, E. C.; Bdikin, Igor; Kholkin, A. L.

doi:10.1063/1.4801961

Cited by 27 publications

(20 citation statements)

References 38 publications

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“…Although recent studies on the thickness dependence of self-polarization in PZT thin films 28 prepared by the same chemical method used in the present work have excluded Schottky barriers and mechanical coupling near the filmsubstrate interface and assumed that complex defects are the probable mechanisms responsible by self-polarization, 29 the situation observed in the present work for PLZT films is different. In other words, while the self-polarization in PZT films occurs in the bulk, our results indicate the Schottky barriers close to the bottom film-substrate interface seems the dominant mechanism responsible for the self-polarization in PLZT film.…”

Section: Resultscontrasting

confidence: 52%

Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films

Melo

Araújo

Shvartsman

et al. 2016

Journal of Applied Physics

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Polycrystalline lanthanum lead zirconate titanate (PLZT) thin films were deposited on Pt/TiO2/SiO2/Si substrates to study the effects of the thickness and grain size on their structural and piezoresponse properties at nanoscale. Thinner PLZT films show a slight (100)-orientation tendency that tends to random orientation for the thicker film, while microstrain and crystallite size increases almost linearly with increasing thickness. Piezoresponse force microscopy and autocorrelation function technique were used to demonstrate the existence of local self-polarization effect and to study the thickness dependence of correlation length. The obtained results ruled out the bulk mechanisms and suggest that Schottky barriers near the film-substrate are likely responsible for a build-in electric field in the films. Larger correlation length evidence that this build-in field increases the number of coexisting polarization directions in larger grains leading to an alignment of macrodomains in thinner films.

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Section: Resultscontrasting

confidence: 52%

Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films

Melo

Araújo

Shvartsman

et al. 2016

Journal of Applied Physics

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“…The thickness dependence of room temperature (a) longitudinal piezoelectric coefficient and (b) relative permittivity in polycrystalline morphotropic‐composition PZT , polycrystalline PL a ZT 12/50/50 and PL a ZT 12/30/70, polycrystalline PL a ZT 5/30/70, epitaxial morphotropic phase boundary PZT , and epitaxial PbZr 0.2 Ti 0.8 O 3 , 0.30BiScO 3 –0.70PbTiO 3 , and K 0.5 Na 0.5 NbO 3 thin films extracted from several independent experimental studies. Within each dataset the crystallographic texture and preparation procedures are consistent.…”

Section: Domain Grain Size and Thickness Scaling Effectsmentioning

confidence: 99%

Scaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process‐Structure‐Property Relations

et al. 2016

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Ferroelectric materials are well‐suited for a variety of applications because they can offer a combination of high performance and scaled integration. Examples of note include piezoelectrics to transform between electrical and mechanical energies, capacitors used to store charge, electro‐optic devices, and nonvolatile memory storage. Accordingly, they are widely used as sensors, actuators, energy storage, and memory components, ultrasonic devices, and in consumer electronics products. Because these functional properties arise from a noncentrosymmetric crystal structure with spontaneous strain and a permanent electric dipole, the properties depend upon physical and electrical boundary conditions, and consequently, physical dimension. The change in properties with decreasing physical dimension is commonly referred to as a size effect. In thin films, size effects are widely observed, whereas in bulk ceramics, changes in properties from the values of large‐grained specimens is most notable in samples with grain sizes below several micrometers. It is important to note that ferroelectricity typically persists to length scales of about 10 nm, but below this point is often absent. Despite the stability of ferroelectricity for dimensions greater than ~10 nm, the dielectric and piezoelectric coefficients of scaled ferroelectrics are suppressed relative to their bulk counterparts, in some cases by changes up to 80%. The loss of extrinsic contributions (domain and phase boundary motion) to the electromechanical response accounts for much of this suppression. In this article, the current understanding of the underlying mechanisms for this behavior in perovskite ferroelectrics is reviewed. We focus on the intrinsic limits of ferroelectric response, the roles of electrical and mechanical boundary conditions, grain size and thickness effects, and extraneous effects related to processing. In many cases, multiple mechanisms combine to produce the observed scaling effects.

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“…1. The X–ray diffraction patterns of PZT thin films show single–phase perovskite peaks32, and that of BZN thin films show cubic pyrochlore peaks29, no extra peaks were observed in either thin films. The PZT/BZN bilayer thin films were composed of a perovskite PZT phase and a cubic pyrochlore BZN phase.…”

Section: Resultsmentioning

confidence: 93%

Multilayer thin films with compositional PbZr0.52Ti0.48O3/Bi1.5Zn1.0Nb1.5O7 layers for tunable applications

Zhang

et al. 2015

Sci Rep

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The dielectric properties and tunability of multilayer thin films with compositional PbZr0.52Ti0.48O3/Bi1.5Zn1.0Nb1.5O7 (PZT/BZN) layers (PPBLs) fabricated by pulsed laser deposition on Pt/TiO2/SiO2/Si substrate have been investigated. Dielectric measurements indicate that the PZT/BZN bilayer thin films exhibit medium dielectric constant of about 490, low loss tangent of 0.017, and superior tunable dielectric properties (tunability = 49.7% at 500 kV/cm) at a PZT/BZN thickness ratio of 3, while the largest figure of merit is obtained as 51.8. The thickness effect is discussed with a series connection model of bilayer capacitors, and the calculated dielectric constant and loss tangent are obtained. Furthermore, five kinds of thin–film samples comprising single bilayers, two, three, four and five PPBLs were also elaborated with the final same thickness. The four PPBLs show the largest dielectric constant of ~538 and tunability of 53.3% at a maximum applied bias field of 500 kV/cm and the lowest loss tangent of ~0.015, while the largest figure of merit is 65.6. The results indicate that four PPBLs are excellent candidates for applications of tunable devices.

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Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films

Cited by 27 publications

References 38 publications

Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films

Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films

Scaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process‐Structure‐Property Relations

Multilayer thin films with compositional PbZr0.52Ti0.48O3/Bi1.5Zn1.0Nb1.5O7 layers for tunable applications

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