2018
DOI: 10.1016/j.actamat.2018.03.046
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Thickness dependent response of domain wall motion in declamped {001} Pb(Zr0·3Ti0.7)O3 thin films

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Cited by 26 publications
(8 citation statements)
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“…The difference in the activation fields between the dense and the porous sample indicates easier polarization reversal in the porous materials, possibly due to different mechanical boundary conditions in the vicinity of the pores compared with the dense counterpart. Enhanced domain switching fraction of ferroelectric/ferroelastic domains in porous films, as compared to their dense counterparts, has been previously observed [70,71] and was related to substrate declamping effects [72,73]. However, more detailed investigations using advanced diffraction techniques are required in bulk porous materials to fully understand, and potentially utilize, this behaviour in the future.…”
Section: Mechanical Boundary Conditionsmentioning
confidence: 88%
“…The difference in the activation fields between the dense and the porous sample indicates easier polarization reversal in the porous materials, possibly due to different mechanical boundary conditions in the vicinity of the pores compared with the dense counterpart. Enhanced domain switching fraction of ferroelectric/ferroelastic domains in porous films, as compared to their dense counterparts, has been previously observed [70,71] and was related to substrate declamping effects [72,73]. However, more detailed investigations using advanced diffraction techniques are required in bulk porous materials to fully understand, and potentially utilize, this behaviour in the future.…”
Section: Mechanical Boundary Conditionsmentioning
confidence: 88%
“…[41][42][43][44][45][46][47][48] However, extrinsic factors such as interfacial properties, residual stress, chemical defects and structural defects (including grain boundaries) can also have a huge influence on domain switching. 35,[49][50][51][52][53][54][55][56][57] The significant influence of extrinsic factors is perhaps best manifested by the fact that real Ec values determined experimentally from hysteresis measurements are typically much smaller (<10 %) than the intrinsic values predicted by Landau-Ginzburg theory. 45 As a result, the frequency dependence of ferroelectric hysteresis measurements can provide valuable information concerning the domain kinetics and type of extrinsic factors that are dominant in a ferroelectric.…”
Section: Frequency Dependence Of Hysteresismentioning
confidence: 99%
“…Figure f exhibits the frequency-dependent dielectric constant and dielectric loss. The dielectric constant increases with increasing film thickness from 560 to 702 at 1 kHz, mainly due to the substrate clamping effect. , All of the PNZT thin films have a relatively low dielectric loss below 2%. Figure g shows typical ferroelectric hysteresis loops with increasing applied voltages for 2L samples, with a saturation polarization P s of 37.6 μC/cm 2 and a remnant polarization P r of 19.5 μC/cm 2 .…”
Section: Resultsmentioning
confidence: 99%