2015
DOI: 10.1016/j.apsusc.2015.01.124
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Thickness dependent structural, optical and electrical properties of Ti-doped ZnO films prepared by atomic layer deposition

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Cited by 15 publications
(16 citation statements)
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“…The crystallites have an apparent rice grain shape (average grain size ~ 80 nm), which is different from the round shaped grains of undoped ZnO (Figure 2), as described elsewhere. 27 The sequence B leads to thicker films with higher [Ti]/[Zn] atomic ratio (as determined from EDS measurements), which is consistent with its higher mass gain observed previously by QCM analysis. In fact, in case of sequence B, the TTIP precursor is pulsed on an OH-terminated surface, which is more reactive than a Zn-Et terminated one, and leads to a higher mass gain over the TiO2 cycle (Figure 1d).…”
Section: Influence Of the Sequence Of Precursor Introductionsupporting
confidence: 88%
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“…The crystallites have an apparent rice grain shape (average grain size ~ 80 nm), which is different from the round shaped grains of undoped ZnO (Figure 2), as described elsewhere. 27 The sequence B leads to thicker films with higher [Ti]/[Zn] atomic ratio (as determined from EDS measurements), which is consistent with its higher mass gain observed previously by QCM analysis. In fact, in case of sequence B, the TTIP precursor is pulsed on an OH-terminated surface, which is more reactive than a Zn-Et terminated one, and leads to a higher mass gain over the TiO2 cycle (Figure 1d).…”
Section: Influence Of the Sequence Of Precursor Introductionsupporting
confidence: 88%
“…All films are n-doped and the carrier concentration slightly increases with the film thickness (N = 10 20 -10 21 cm -3 ), as well as the mobility (1 -150 cm 2 V -1 s -1 ), which is in accordance to previously reported systems. 23,[25][26][27]29 It seems that thinner films (thickness < 50 nm) suffer significantly from the grain boundaries scattering due to the presence of smaller grains. 27 The resistivity of all films is in the order of 10 -3 Ω cm; the lowest resistivity value of 5 × 10 -4 Ω cm is seen for 150 nm thick films, which is slightly more conductive than systems reported by Bergum et al 27 Interestingly, the FoM increases monotonically as a function of the film thickness for TZO (Figure 4b).…”
Section: Influence Of the Cycle Ratio {Tio2}:{zno} And The Film Thickmentioning
confidence: 99%
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