Thickness measurement of coated Ni on brass plate using Kα/Kβ ratio by XRF spectrometry

Karimi, M.; Amiri, Nayereh; Shabani, Amir Ali Tabbakh

doi:10.1002/xrs.1146

Cited by 21 publications

(8 citation statements)

References 6 publications

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“…The relative intensity of analyte lines in the X-ray spectrum may be measured as a means to assess the thickness of thin films and multilayers. Karimi et al 475 used the relative intensities of Cu and Ni K lines to measure a Ni layer on brass. The Ka/Kb ratios of the two analytes increased as a function of the Ni layer thickness on a brass plate sample in the range of fractions of one to several micrometers.…”

Section: Thin Films Coatings and Nano-materialsmentioning

confidence: 99%

Atomic spectrometry update–X-ray fluorescence spectrometry

West

Ellis

Potts

et al. 2010

J. Anal. At. Spectrom.

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Section: Thin Films Coatings and Nano-materialsmentioning

confidence: 99%

Atomic spectrometry update–X-ray fluorescence spectrometry

West

Ellis

Potts

et al. 2010

J. Anal. At. Spectrom.

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“…Energy dispersive X‐ray fluorescence (EDXRF) spectrometry is a widely used spectro‐analytical method for simultaneous elemental analysis in materials. The technique has wide applications among others industrial, agricultural, geological, medical and environmental analysis.…”

Section: Introductionmentioning

confidence: 99%

Principal component analysis‐assisted energy dispersive X‐ray fluorescence spectroscopy for non‐invasive quality assurance characterization of complex matrix materials

et al. 2012

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The analytical challenges in direct quality assurance analysis of complex matrices (extreme matrix effects, spectral overlap, poor signal-to-noise ratio (SNR) for trace analytes, 'dark matrix', imprecise geometry, need for sample integrity) by energy dispersive X-ray fluorescence (EDXRF) spectrometry necessitate development of novel techniques for material characterization. We demonstrate the utility of principal component analysis (PCA) in isotope-excited EDXRF spectrometry of a complex matrix (in this case lubricating oil) in the context of a newly developed EDXRF and scattering (EDXRFS) technique. Lubricating oil quality may be interpreted in terms of its viscosity, anti-wear, anti-oxidation, and anti-rust properties, which are detectable via B, Ca, Mg, Zn, Fe, Na additives (quality markers). Our method involves simultaneous non-invasive acquisition of both fluorescence and scatter spectra from samples held in a propylene dish, and their modeling in a reduced multidimensional space for an interpretable overview that is analytically more useful than, and complementary to, fluorescence peak-based quantitation of the additives; by this method, only Fe and Zn are directly detectable, but with SNR of the fluorescence peak 15-20 times poorer compared with analysis after sample digestion. Although Fe and Zn cannot distinguish the various lubricating oil brands, it can differentiate authentic from adulterated. The method was however found to be analytically useful when combined with PCA: various brands of lubricating oil were discriminated in addition to the detection of adulteration. PCA processing of the spectra showed that the most important quality assurance spectral signature information responsible for the success is contained in the scatter region (low-Z elements). Evaluation of the performance of the method with respect to SNR (i.e. analysis time and therefore speed) showed that there was no significant difference in method performance of analysis live time in the range 100-1000 s, showing proof of concept for rapid characterization of complex matrix materials by PCA-assisted EDXRFS.

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“…It was applied to determine the coating thickness. In a limited range of coating thickness, this method works very precisely and is close to linear regime, both for the spectral lines of the covering element and for the element beneath [14]. As the measurements of coating thickness is still important in the applications of XRF technique, the method described above is not the only technique leading to linear relationships.…”

Section: Smart Use Of Principlesmentioning

confidence: 94%

New applications of the good old wavelength-dispersive X-ray fluorescence

Kuczumow

Wolski

2011

Pramana - J Phys

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Wavelength-dispersive X-ray fluorescence can be characterized by its advantages and drawbacks. Unbeaten spectral resolution in a range below 5 keV, good operational stability, excellent ability of making averaged analysis, and good presentation of peak shape which gives the basis for the chemical speciation are the advantages. Among the drawbacks, the following are important: system with sequential analysis of particular elements, low output of energy supplied to the device, and great cost of instrument which can be amortized only in routine operations. In routine geological and environmental analyses, the WD-XRF performs better than other simpler instrumental or wet techniques. WD-XRF is continuously improved, by applying new multilayer interference mirrors (MIM) for detection and quantification of very light elements. Bad spectral resolution of MIM noted earlier is now improved by tailoring their shape to the shape of gratings. The progress in the long wavelength spectral region joined with efficient and precise wavelength resolution systems enables the application of WD-XRF for speciation analysis. In another effort, XRF spectrometry is treated as a tool for obtaining quantitative basis for the judgement on Linnaean systematic classification of plants and opens the field to a new discipline -quantitative biology.

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Thickness measurement of coated Ni on brass plate using Kα/Kβ ratio by XRF spectrometry

Cited by 21 publications

References 6 publications

Atomic spectrometry update–X-ray fluorescence spectrometry

Atomic spectrometry update–X-ray fluorescence spectrometry

Principal component analysis‐assisted energy dispersive X‐ray fluorescence spectroscopy for non‐invasive quality assurance characterization of complex matrix materials

New applications of the good old wavelength-dispersive X-ray fluorescence

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