Thickness measurement of thin polymer films by total internal reflection Raman and attenuated total reflection infrared spectroscopy

Kivioja, Antti; Jääskeläinen, Anna‐Stiina; Ahtee, Ville; Vuorinen, Tapani

doi:10.1016/j.vibspec.2012.02.014

Cited by 13 publications

(13 citation statements)

References 30 publications

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“…Thickness measurements of thin isotropic PS films on polypropylene substrates were performed by Kivioja et al using TIR-Raman spectroscopy. 24 Scanning angle (SA) Raman spectroscopy (alternatively known as variable angle Raman spectroscopy) is similar to TIR-Raman spectroscopy in that both techniques utilize similar sample geometries. However, unlike TIR-Raman spectroscopy, in which the angle of incidence at the prismsample interface is usually fixed and equal to or greater than the critical angle required for TIR, SA Raman spectroscopy is performed by scanning the incidence of the laser excitation over a range of angles while collecting the Raman scattered light.…”

Section: Introductionmentioning

confidence: 99%

Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision

Damin

Nguyen

Niyibizi

et al. 2015

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Near-infrared scanning angle (SA) Raman spectroscopy was utilized to determine the interface location in bilayer films (a stack of two polymer layers) of polystyrene (PS) and polycarbonate (PC). Finite-difference-time-domain (FDTD) calculations of the sum square electric field (SSEF) for films with total bilayer thicknesses of 1200-3600 nm were used to construct models for simultaneously measuring the film thickness and the location of the buried interface between the PS and PC layers. Samples with total thicknesses of 1320, 1890, 2300, and 2750 nm and varying PS/PC interface locations were analyzed using SA Raman spectroscopy. Comparing SA Raman spectroscopy and optical profilometry measurements, the average percent difference in the total bilayer thickness was 2.0% for films less than ∼2300 nm thick. The average percent difference in the thickness of the PS layer, which reflects the interface location, was 2.5% when the PS layer was less than ∼1800 nm. SA Raman spectroscopy has been shown to be a viable, non-destructive method capable of determining the total bilayer thickness and buried interface location for bilayer samples consisting of thin polymer films with comparable indices of refraction.

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Section: Introductionmentioning

confidence: 99%

Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision

Damin

Nguyen

Niyibizi

et al. 2015

Analyst

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“…2. 19 The incident IR radiation (I 0 ) with incident angle (h) is totally reflected at the IRE-ink or ink-coating component interface, which creates an exponential decaying evanescent wave (I).…”

Section: Methodsmentioning

confidence: 99%

Use of Total Internal Reflection Raman (TIR) and Attenuated Total Reflection Infrared (ATR-IR) Spectroscopy to Analyze Component Separation in Thin Offset Ink Films after Setting on Coated Paper Surfaces

et al. 2013

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The interactive behavior of ink constituents with porous substrates during and after the offset print process has an important effect on the quality of printed products. To help elucidate the distribution of ink components between the retained ink layer and the substrate, a variety of spectroscopic and microscopic analysis techniques have been developed. This paper describes for the first time the use of total internal reflection (TIR) Raman spectroscopy to analyze the penetration behavior of separated offset ink components (linseed oil, solid color pigment) in coated papers providing chemically intrinsic information rapidly, nondestructively, and with minimal sample preparation. In addition, the already widely applied technique of attenuated total reflection infrared spectroscopy (ATR-IR) was evaluated in parallel and compared. The results of the ATR-IR Raman clearly revealed an improvement in uppermost depth resolution compared with values previously published from other nondestructive techniques, and the method is shown to be capable of providing new knowledge of the setting of thin (0.25-2 μm) offset ink films, allowing the spreading and the penetration behavior on physically different paper coating surfaces to be studied.

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“…used total internal reflection (TIR) Raman imaging for the first time to measure the thickness of polystyrene (PS) films on a polypropylene (PP) substrate [45]. It was revealed that this fast and non-destructive technique could be adapted for measuring the thickness of the multilayer polymer films which is one of the most highlighted parts of this research.…”

Section: Raman Spectroscopymentioning

confidence: 99%

“…Meyer et al extended the characterization of polystyrene films by measuring their thickness and chemical composition using scanning angle (SA) Raman imaging spectroscopy [46]. The thickness of the samples studied was between 400 nm and 1.8 µm, which is a wider range compared to Kivioja et al [45].…”

Section: Raman Spectroscopymentioning

confidence: 99%

Characterization of PLA-talc films using NIR chemical imaging and Multivariate Image Analysis techniques

2018

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Maîtrise en génie chimiqueToutefois, puisque la structure de ces films est plus complexe, le contrôle de qualité de ces derniers est plus difficile. Dans l'industrie, des méthodes hors-ligne sont très souvent utilisées pour effectuer le contrôle de qualité des films produits. Le contrôle est nécessaire puisque la variabilité de la matière première ainsi que le changement des conditions opératoires amènent des modifications qui changent considérablement les propriétés du film. Par conséquent, une inspection en temps réel ainsi qu'un contrôle des films de polymère est nécessaire sur la ligne de production afin d'obtenir un contrôle de qualité s'approchant de l'analyse en temps réel.Un système d'imagerie proche infrarouge (NIR) rapide et non-destructif est proposé pour caractériser les films biodégradables d'acide polylactique contenant du talc produits par extrusion-soufflage et utilisés pour l'emballage. Le but ultime est d'utiliser le système pour faire un contrôle de qualité sur la ligne d'extrusion ainsi qu'après le post-traitement thermique, soit le recuit. Un ensemble d'échantillon de film de PLA contenant différentes concentrations en talc ont été fabriqués. Ces derniers ont ensuite été soumis à différentes conditions de recuit. Des images NIR ont été collectées avant la caractérisation des propriétés physiques et mécaniques ainsi que l'étanchéité aux gaz. Des techniques d'imagerie multivariées ont été appliquées aux images hyperspectrales. Celles-ci ont montré que la quantité de talc peut être déterminée et que l'information du spectre NIR permet de prédire les propriétés du film. Dans tous les cas, la méthode proposée permet de déterminer les variations dans les propriétés du film avec une bonne précision. iv AbstractFood packaging plays a great role in the food industry to maintain food products quality as long as possible. Polymer films are widely used in food packaging and also attract attention because of their outstanding advantages. Since petroleum-based polymers are known to cause environmental concerns, biodegradable polymers like PLA were studied more intensively in recent years due to their environmentally friendly properties. The application of reinforced films exceeds simple ones in achieving specific functions and enhancing their properties such as barrier properties. Since the films structures are more complex, quality control is more challenging. In industry, off-line methods are vastly used for quality control of the produced films while variability in raw materials and processing conditions substantially change the film specifications. Consequently, real-time inspection and monitoring of polymer films is needed on the production line to achieve a real-time quality control of the films.A fast and non-invasive near-infrared (NIR) imaging system is proposed to characterize biodegradable polylactic acid (PLA) films containing talc, and produced by extrusion film-blowing for packaging applications. The ultimate goal is to use the system for quality control on the extrusion line, and after a po...

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Thickness measurement of thin polymer films by total internal reflection Raman and attenuated total reflection infrared spectroscopy

Cited by 13 publications

References 30 publications

Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision

Application of scanning angle Raman spectroscopy for determining the location of buried polymer interfaces with tens of nanometer precision

Use of Total Internal Reflection Raman (TIR) and Attenuated Total Reflection Infrared (ATR-IR) Spectroscopy to Analyze Component Separation in Thin Offset Ink Films after Setting on Coated Paper Surfaces

Characterization of PLA-talc films using NIR chemical imaging and Multivariate Image Analysis techniques

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